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XPS characterization of the oxide scale on fully processed non-oriented electrical steel sheet
An X-ray photoelectron spectroscopy analysis of the surface of fully processed, non-oriented, electrical steel sheet was performed in an attempt to elucidate the chemistry of the complex oxide scale. Ar + sputtering was used to clean the surface contamination. Not only Fe 2+, but also Fe 0 states we...
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Published in: | Materials characterization 2011-05, Vol.62 (5), p.503-508 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | An X-ray photoelectron spectroscopy analysis of the surface of fully processed, non-oriented, electrical steel sheet was performed in an attempt to elucidate the chemistry of the complex oxide scale. Ar
+ sputtering was used to clean the surface contamination. Not only Fe
2+, but also Fe
0 states were detected in addition to the Fe
3+ in the top several tens of nanometers of the 1–5-μm-thick complex oxide scales. This reduction of iron was explained as being due to the preferential sputtering of the oxygen atoms from the iron compounds in the Ar
+ sputtering process. A fayalite reduction mechanism is proposed to account for the reduction of the iron down to Fe
0. The results of the study indicate that X-ray photoelectron spectroscopy is limited to the determination of thick, complex oxides in multicomponent iron alloys.
► XPS analysis of the 1–5-μm-thick oxide scales of NO-electrical steel was performed. ► Not only Fe
3+ and Fe
2+, but also Fe
0 were detected in the very subsurface layers. ► A fayalite reduction mechanism is proposed for the reduction of the iron to Fe
0. |
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ISSN: | 1044-5803 1873-4189 |
DOI: | 10.1016/j.matchar.2011.03.011 |