Soft x-ray scattering facility at the Advanced Light Source with real-time data processing and analysis

We present the development and characterization of a dedicated resonant soft x-ray scattering facility. Capable of operation over a wide energy range, the beamline and endstation are primarily used for scattering from soft matter systems around the carbon K-edge (∼285 eV). We describe the specialize...

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Bibliographic Details
Published in:Review of scientific instruments 2012-04, Vol.83 (4), p.045110-045110-14
Main Authors: Gann, E., Young, A. T., Collins, B. A., Yan, H., Nasiatka, J., Padmore, H. A., Ade, H., Hexemer, A., Wang, C.
Format: Article
Language:English
Subjects:
ADVANCED LIGHT SOURCE
BACKGROUND NOISE
Beams (radiation)
CARBON
COMPUTER CODES
DATA ACQUISITION
DATA ANALYSIS
DATA PROCESSING
EV RANGE
HARMONICS
Higher harmonics
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
PHOTON BEAMS
POLARIZATION
Real time
Scattering
SOFT X RADIATION
Soft x-rays
Spectra
X-RAY DIFFRACTION
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Summary:We present the development and characterization of a dedicated resonant soft x-ray scattering facility. Capable of operation over a wide energy range, the beamline and endstation are primarily used for scattering from soft matter systems around the carbon K-edge (∼285 eV). We describe the specialized design of the instrument and characteristics of the beamline. Operational characteristics of immediate interest to users such as polarization control, degree of higher harmonic spectral contamination, and detector noise are delineated. Of special interest is the development of a higher harmonic rejection system that improves the spectral purity of the x-ray beam. Special software and a user-friendly interface have been implemented to allow real-time data processing and preliminary data analysis simultaneous with data acquisition.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.3701831