Quantitatively identical orientation-dependent ionization energy and electron affinity of diindenoperylene

Molecular orientation dependences of the ionization energy (IE) and the electron affinity (EA) of diindenoperylene (DIP) films were studied by using ultraviolet photoemission spectroscopy and inverse photoemission spectroscopy. The molecular orientation was controlled by preparing the DIP films on g...

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Bibliographic Details
Published in:Applied physics letters 2013-12, Vol.103 (25)
Main Authors: Han, W. N., Yonezawa, K., Makino, R., Kato, K., Hinderhofer, A., Murdey, R., Shiraishi, R., Yoshida, H., Sato, N., Ueno, N., Kera, S.
Format: Article
Language:English
Subjects:
AFFINITY
Applied physics
ATOMIC AND MOLECULAR PHYSICS
Bonding
Electron affinity
Electrons
EV RANGE 01-10
GRAPHITE
HYDROGEN IONS 1 PLUS
IONIZATION
ORGANIC COMPOUNDS
ORIENTATION
Photoelectric emission
PHOTOELECTRON SPECTROSCOPY
PHOTOEMISSION
POTENTIALS
SILICA
Silicon dioxide
SILICON OXIDES
Spectrum analysis
SUBSTRATES
SURFACES
TAILINGS
THIN FILMS
ULTRAVIOLET RADIATION
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Summary:Molecular orientation dependences of the ionization energy (IE) and the electron affinity (EA) of diindenoperylene (DIP) films were studied by using ultraviolet photoemission spectroscopy and inverse photoemission spectroscopy. The molecular orientation was controlled by preparing the DIP films on graphite and SiO2 substrates. The threshold IE and EA of DIP thin films were determined to be 5.81 and 3.53 eV for the film of flat-lying DIP orientation, respectively, and 5.38 and 3.13 eV for the film of standing DIP orientation, respectively. The result indicates that the IE and EA for the flat-lying film are larger by 0.4 eV and the frontier orbital states shift away from the vacuum level compared to the standing film. This rigid energy shift is ascribed to a surface-electrostatic potential produced by the intramolecular polar bond (>C−-H+) for standing orientation and π-electron tailing to vacuum for flat-lying orientation.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4850531