Feasibility test of Z{sub eff} imaging using x-ray interferometry

Elemental imaging using X-ray interferometry has been developed. Since the atomic number (Z) of a single-element sample (effective atomic number (Z{sub eff}) for a plural-element sample) corresponds to the ratio of the real to imaginary part of the complex refractive index, an elemental map is calcu...

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Bibliographic Details
Published in:Applied physics letters 2013-11, Vol.103 (20)
Main Authors: Yoneyama, Akio, Hyodo, Kazuyuki, Takeda, Tohoru
Format: Article
Language:English
Subjects:
ABSORPTION
ALUMINIUM
ATOMIC NUMBER
COPPER
CRYSTALS
FOILS
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
INTERFEROMETRY
IRON
NICKEL
PHASE SHIFT
REFRACTIVE INDEX
X RADIATION
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Summary:Elemental imaging using X-ray interferometry has been developed. Since the atomic number (Z) of a single-element sample (effective atomic number (Z{sub eff}) for a plural-element sample) corresponds to the ratio of the real to imaginary part of the complex refractive index, an elemental map is calculable with the ratio of an absorption and phase-contrast image. Several metal foils underwent feasibility observations by crystal X-ray interferometry, providing accurate detection of X-ray intensity and phase-shift. The obtained Z{sub eff} image shows that aluminum, iron, nickel, and copper foil were clearly distinguished, and nickel and copper's Z{sub eff} values coincide with ideal Z number within 1%.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4831773