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Compton scattering for spectroscopic detection of ultra-fast, high flux, broad energy range X-rays

Compton side-scattering has been used to simultaneously downshift the energy of keV to MeV energy range photons while attenuating their flux to enable single-shot, spectrally resolved, measurements of high flux X-ray sources to be undertaken. To demonstrate the technique a 1 mm thick pixelated cadmi...

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Bibliographic Details
Published in:Review of scientific instruments 2013-11, Vol.84 (11), p.113302-113302
Main Authors: Cipiccia, S, Wiggins, S M, Maneuski, D, Brunetti, E, Vieux, G, Yang, X, Issac, R C, Welsh, G H, Anania, M, Islam, M R, Ersfeld, B, Montgomery, R, Smith, G, Hoek, M, Hamilton, D J, Lemos, N R C, Symes, D R, Rajeev, P P, Shea, V O, Dias, J M, Jaroszynski, D A
Format: Article
Language:English
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Summary:Compton side-scattering has been used to simultaneously downshift the energy of keV to MeV energy range photons while attenuating their flux to enable single-shot, spectrally resolved, measurements of high flux X-ray sources to be undertaken. To demonstrate the technique a 1 mm thick pixelated cadmium telluride detector has been used to measure spectra of Compton side-scattered radiation from a Cobalt-60 laboratory source and a high flux, high peak brilliance X-ray source of betatron radiation from a laser-plasma wakefield accelerator.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.4825374