Using X-ray free-electron lasers for probing of complex interaction dynamics of ultra-intense lasers with solid matter

We demonstrate the potential of X-ray free-electron lasers (XFEL) to advance the understanding of complex plasma dynamics by allowing for the first time nanometer and femtosecond resolution at the same time in plasma diagnostics. Plasma phenomena on such short timescales are of high relevance for ma...

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Bibliographic Details
Published in:Physics of plasmas 2014-03, Vol.21 (3)
Main Authors: Kluge, T., Gutt, C., Huang, L. G., Metzkes, J., Schramm, U., Bussmann, M., Cowan, T. E.
Format: Article
Language:English
Subjects:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ABSORPTION
BEAMS
Dusty plasmas
Electron transport
Feasibility studies
Femtosecond pulsed lasers
FREE ELECTRON LASERS
INTERACTIONS
Lasers
PLASMA DIAGNOSTICS
Plasma dynamics
Plasma physics
POTENTIALS
PROBES
RELATIVISTIC RANGE
SMALL ANGLE SCATTERING
Small angle X ray scattering
SOLIDS
SURFACES
TAIL ELECTRONS
X RADIATION
X-RAY DIFFRACTION
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Summary:We demonstrate the potential of X-ray free-electron lasers (XFEL) to advance the understanding of complex plasma dynamics by allowing for the first time nanometer and femtosecond resolution at the same time in plasma diagnostics. Plasma phenomena on such short timescales are of high relevance for many fields of physics, in particular in the ultra-intense ultra-short laser interaction with matter. Highly relevant yet only partially understood phenomena become directly accessible in experiment. These include relativistic laser absorption at solid targets, creation of energetic electrons and electron transport in warm dense matter, including the seeding and development of surface and beam instabilities, ambipolar expansion, shock formation, and dynamics at the surfaces or at buried layers. In this paper, we focus on XFEL plasma probing for high power laser matter interactions based on quantitative calculations using synthesized data and evaluate the feasibility of various imaging and scattering techniques with special focus on the small angle X-ray scattering technique.
ISSN:1070-664X
1089-7674
DOI:10.1063/1.4869331