Development of an X-ray pixel detector with multi-port charge-coupled device for X-ray free-electron laser experiments

This paper presents development of an X-ray pixel detector with a multi-port charge-coupled device (MPCCD) for X-ray Free-Electron laser experiments. The fabrication process of the CCD was selected based on the X-ray radiation hardness against the estimated annual dose of 1.6 × 10(14) photon/mm(2)....

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Bibliographic Details
Published in:Review of scientific instruments 2014-03, Vol.85 (3), p.033110-033110
Main Authors: Kameshima, Takashi, Ono, Shun, Kudo, Togo, Ozaki, Kyosuke, Kirihara, Yoichi, Kobayashi, Kazuo, Inubushi, Yuichi, Yabashi, Makina, Horigome, Toshio, Holland, Andrew, Holland, Karen, Burt, David, Murao, Hajime, Hatsui, Takaki
Format: Article
Language:English
Subjects:
CALIBRATION
CHARGE-COUPLED DEVICES
FREE ELECTRON LASERS
HARDNESS
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
KEV RANGE 01-10
PHOTONS
Pixels
RADIATION DETECTORS
READOUT SYSTEMS
Scientific apparatus & instruments
Semiconductors
SENSORS
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Summary:This paper presents development of an X-ray pixel detector with a multi-port charge-coupled device (MPCCD) for X-ray Free-Electron laser experiments. The fabrication process of the CCD was selected based on the X-ray radiation hardness against the estimated annual dose of 1.6 × 10(14) photon/mm(2). The sensor device was optimized by maximizing the full well capacity as high as 5 Me- within 50 μm square pixels while keeping the single photon detection capability for X-ray photons higher than 6 keV and a readout speed of 60 frames/s. The system development also included a detector system for the MPCCD sensor. This paper summarizes the performance, calibration methods, and operation status.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.4867668