Surface analysis insight note: Illustrating the effect of adventitious contamination on Pt photoemission peak intensities

Adventitious carbon contaminations are not only omnipresent and used for charge referencing of XPS spectra but also can alter the apparent presence of the element peaks that span over the large spectral window of binding energies. This Insight note describes the effect of an adventitious contaminati...

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Bibliographic Details
Published in:Surface and interface analysis 2024-02, Vol.56 (2), p.122-125
Main Authors: Fairley, Neal, Bargiela, Pascal, Baltrusaitis, Jonas
Format: Article
Language:English
Subjects:
adventitious carbon
Catalysis
Chemical Sciences
component spectra
Contamination
Environment and Society
Environmental Sciences
Ion beams
linear least squares
Photoelectric emission
platinum
Spectra
Surface analysis (chemical)
XPS
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Summary:Adventitious carbon contaminations are not only omnipresent and used for charge referencing of XPS spectra but also can alter the apparent presence of the element peaks that span over the large spectral window of binding energies. This Insight note describes the effect of an adventitious contamination layer on Pt and presents, in brief, the approach whereby the component spectra are derived for ion beam cleaned Pt samples that can then utilize linear mathematics to peak fit said spectra thus quantifying the amount of each component including that assigned to the contamination itself of Pt metal.
ISSN:0142-2421
1096-9918
DOI:10.1002/sia.7276