2D potential measurements by applying automatic beam adjustment system to heavy ion beam probe diagnostic on the Large Helical Device

Two-dimensional potential profiles in the Large Helical Device (LHD) were measured with heavy ion beam probe (HIBP). To measure the two-dimensional profile, the probe beam energy has to be changed. However, this task is not easy, because the beam transport line of LHD-HIBP system is very long (∼20 m...

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Bibliographic Details
Published in:Review of scientific instruments 2014-11, Vol.85 (11), p.11D853-11D853
Main Authors: Shimizu, A, Ido, T, Kurachi, M, Makino, R, Nishiura, M, Kato, S, Nishizawa, A, Hamada, Y
Format: Article
Language:English
Subjects:
BEAM TRANSPORT
HEAVY IONS
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ION BEAMS
ION PROBES
LHD DEVICE
PARTICLE ACCELERATORS
TWO-DIMENSIONAL CALCULATIONS
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Summary:Two-dimensional potential profiles in the Large Helical Device (LHD) were measured with heavy ion beam probe (HIBP). To measure the two-dimensional profile, the probe beam energy has to be changed. However, this task is not easy, because the beam transport line of LHD-HIBP system is very long (∼20 m), and the required beam adjustment consumes much time. To reduce the probe beam energy adjustment time, an automatic beam adjustment system has been developed. Using this system, required time to change the probe beam energy is dramatically reduced, such that two-dimensional potential profiles were able to be successfully measured with HIBP by changing the probe beam energy shot to shot.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.4891975