Polarity of semipolar wurtzite crystals: X-ray photoelectron diffraction from GaN{101¯1} and GaN{202¯1} surfaces

Polarity of semipolar GaN(101¯1) (101¯1¯) and GaN(202¯1) (202¯1¯) surfaces was determined with X-ray photoelectron diffraction (XPD) using a standard MgKα source. The photoelectron emission from N 1s core level measured in the a-plane of the crystals shows significant differences for the two crystal...

Full description

Saved in:
Bibliographic Details
Published in:Journal of applied physics 2014-09, Vol.116 (10)
Main Authors: Romanyuk, O., Jiříček, P., Paskova, T., Bartoš, I.
Format: Article
Language:English
Subjects:
Applied physics
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Crystal structure
CRYSTALS
ELECTRON DIFFRACTION
GALLIUM NITRIDES
ORIENTATION
Polarity
SURFACES
Wurtzite
X RADIATION
X-RAY DIFFRACTION
X-RAY PHOTOELECTRON SPECTROSCOPY
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Polarity of semipolar GaN(101¯1) (101¯1¯) and GaN(202¯1) (202¯1¯) surfaces was determined with X-ray photoelectron diffraction (XPD) using a standard MgKα source. The photoelectron emission from N 1s core level measured in the a-plane of the crystals shows significant differences for the two crystal orientations within the polar angle range of 80–100° from the 〈0001〉 normal. It was demonstrated that XPD polar plots recorded in the a-plane are similar for each polarity of the GaN{101¯1} and GaN{202¯1} crystals if referred to 〈0001〉 crystal axes. For polarity determinations of all important GaN{h0h¯l} semipolar surfaces, the above given polar angle range is suitable.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.4894708