High precision measurement of undulator polarization in the regime of hard x-rays

We have measured the polarization purity of undulator radiation at 12.9 keV, with hitherto unachievable precision. We could measure a polarization purity of 1.8 × 10−4 by using a silicon channel-cut crystal with six Bragg reflections at 45° as analyzer.

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Bibliographic Details
Published in:Applied physics letters 2014-07, Vol.105 (2)
Main Authors: Marx, B., Schulze, K. S., Uschmann, I., Kämpfer, T., Wehrhan, O., Wille, H. C., Schlage, K., Röhlsberger, R., Weckert, E., Förster, E., Stöhlker, T., Paulus, G. G.
Format: Article
Language:English
Subjects:
ACCURACY
Applied physics
BRAGG REFLECTION
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
CRYSTALS
HARD X RADIATION
IMPURITIES
KEV RANGE 10-100
POLARIZATION
Purity
SILICON
WIGGLER MAGNETS
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Description
Summary:We have measured the polarization purity of undulator radiation at 12.9 keV, with hitherto unachievable precision. We could measure a polarization purity of 1.8 × 10−4 by using a silicon channel-cut crystal with six Bragg reflections at 45° as analyzer.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4890584