The design and construction of a high-resolution velocity-map imaging apparatus for photoelectron spectroscopy studies of size-selected clusters

A new velocity-map imaging apparatus equipped with a laser-vaporization supersonic cluster source and a time-of-flight mass spectrometer is described for high-resolution photoelectron spectroscopy studies of size-selected cluster anions. Vibrationally cold anion clusters are produced using a laser-v...

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Bibliographic Details
Published in:Review of scientific instruments 2014-08, Vol.85 (8), p.083106-083106
Main Authors: León, Iker, Yang, Zheng, Liu, Hong-Tao, Wang, Lai-Sheng
Format: Article
Language:English
Subjects:
ANIONS
Clusters
DESIGN
ELECTRONS
ENERGY RANGE
EVAPORATION
High resolution
Image resolution
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Ions
Kinetic energy
LASERS
LENSES
PHOTOELECTRON SPECTROSCOPY
RESOLUTION
Scientific apparatus & instruments
SIMULATION
Spectroscopic analysis
Spectrum analysis
TESTING
TIME-OF-FLIGHT MASS SPECTROMETERS
Vaporization
VELOCITY
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Summary:A new velocity-map imaging apparatus equipped with a laser-vaporization supersonic cluster source and a time-of-flight mass spectrometer is described for high-resolution photoelectron spectroscopy studies of size-selected cluster anions. Vibrationally cold anion clusters are produced using a laser-vaporization supersonic cluster source, size-selected by a time-of-flight mass spectrometer, and then focused co-linearly into the interaction zone of the high-resolution velocity-map imaging (VMI) system. The multilens VMI system is optimized via systematic simulations and can reach a resolution of 1.2 cm(-1) (FWHM) for near threshold electrons while maintaining photoelectron kinetic energy resolutions (ΔKE/KE) of ~0.53% for higher energy electrons. The new VMI lens has superior focusing power over a large energy range, yielding highly circular images with distortions no larger than 1.0025 between the long and short radii. The detailed design, simulation, construction, testing, and performance of the high-resolution VMI apparatus are presented.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.4891701