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Trap-assisted tunneling in InGaN/GaN single-quantum-well light-emitting diodes

Based on numerical simulation and comparison with measured current characteristics, we show that the current in InGaN/GaN single-quantum-well light-emitting diodes at low forward bias can be accurately described by a standard trap-assisted tunneling model. The qualitative and quantitative difference...

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Published in:Applied physics letters 2014-09, Vol.105 (13)
Main Authors: Auf der Maur, M., Galler, B., Pietzonka, I., Strassburg, M., Lugauer, H., Di Carlo, A.
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cited_by cdi_FETCH-LOGICAL-c351t-218a90ae7772aa8bcf9e3a43b9fb5182ea094bb7516f31220dbda63a2e5da5243
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container_title Applied physics letters
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creator Auf der Maur, M.
Galler, B.
Pietzonka, I.
Strassburg, M.
Lugauer, H.
Di Carlo, A.
description Based on numerical simulation and comparison with measured current characteristics, we show that the current in InGaN/GaN single-quantum-well light-emitting diodes at low forward bias can be accurately described by a standard trap-assisted tunneling model. The qualitative and quantitative differences in the current characteristics of devices with different emission wavelengths are demonstrated to be correlated in a physically consistent way with the tunneling model parameters.
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fullrecord <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_22350825</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2126549560</sourcerecordid><originalsourceid>FETCH-LOGICAL-c351t-218a90ae7772aa8bcf9e3a43b9fb5182ea094bb7516f31220dbda63a2e5da5243</originalsourceid><addsrcrecordid>eNpFkE9LAzEUxIMoWKsHv8GCJw9p85JNsjlK0Voo9VLP4e1utk3ZP-0mi_jt3dKCh-Exw4_HMIQ8A5sBU2IOszQzymh2QybAtKYCILslE8aYoMpIuCcPIRxGK7kQE7LZ9nikGIIP0ZVJHNrW1b7dJb5NVu0SN_NRSRiT2tHTgG0cGvrj6jqp_W4fqWt8jGe-9F3pwiO5q7AO7ul6p-T74327-KTrr-Vq8bamhZAQKYcMDUOnteaIWV5UxglMRW6qXELGHTKT5rmWoCoBnLMyL1EJ5E6WKHkqpuTl8rcL0dtQ-OiKfdGN5YtoOReSZVz-U8e-Ow0uRHvohr4di1kOXMnUSMVG6vVCFX0XQu8qe-x9g_2vBWbPo1qw11HFH50qZ-U</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2126549560</pqid></control><display><type>article</type><title>Trap-assisted tunneling in InGaN/GaN single-quantum-well light-emitting diodes</title><source>American Institute of Physics (AIP) Publications</source><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><creator>Auf der Maur, M. ; Galler, B. ; Pietzonka, I. ; Strassburg, M. ; Lugauer, H. ; Di Carlo, A.</creator><creatorcontrib>Auf der Maur, M. ; Galler, B. ; Pietzonka, I. ; Strassburg, M. ; Lugauer, H. ; Di Carlo, A.</creatorcontrib><description>Based on numerical simulation and comparison with measured current characteristics, we show that the current in InGaN/GaN single-quantum-well light-emitting diodes at low forward bias can be accurately described by a standard trap-assisted tunneling model. The qualitative and quantitative differences in the current characteristics of devices with different emission wavelengths are demonstrated to be correlated in a physically consistent way with the tunneling model parameters.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.4896970</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Applied physics ; Computer simulation ; COMPUTERIZED SIMULATION ; CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ; CURRENTS ; ELECTRIC CONDUCTIVITY ; EMISSION ; GALLIUM NITRIDES ; INDIUM COMPOUNDS ; Indium gallium nitrides ; LIGHT EMITTING DIODES ; Mathematical models ; Organic light emitting diodes ; QUANTUM WELLS ; TRAPS ; TUNNEL EFFECT ; WAVELENGTHS</subject><ispartof>Applied physics letters, 2014-09, Vol.105 (13)</ispartof><rights>2014 AIP Publishing LLC.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c351t-218a90ae7772aa8bcf9e3a43b9fb5182ea094bb7516f31220dbda63a2e5da5243</citedby><cites>FETCH-LOGICAL-c351t-218a90ae7772aa8bcf9e3a43b9fb5182ea094bb7516f31220dbda63a2e5da5243</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,776,778,780,881,27901,27902</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/22350825$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Auf der Maur, M.</creatorcontrib><creatorcontrib>Galler, B.</creatorcontrib><creatorcontrib>Pietzonka, I.</creatorcontrib><creatorcontrib>Strassburg, M.</creatorcontrib><creatorcontrib>Lugauer, H.</creatorcontrib><creatorcontrib>Di Carlo, A.</creatorcontrib><title>Trap-assisted tunneling in InGaN/GaN single-quantum-well light-emitting diodes</title><title>Applied physics letters</title><description>Based on numerical simulation and comparison with measured current characteristics, we show that the current in InGaN/GaN single-quantum-well light-emitting diodes at low forward bias can be accurately described by a standard trap-assisted tunneling model. The qualitative and quantitative differences in the current characteristics of devices with different emission wavelengths are demonstrated to be correlated in a physically consistent way with the tunneling model parameters.</description><subject>Applied physics</subject><subject>Computer simulation</subject><subject>COMPUTERIZED SIMULATION</subject><subject>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</subject><subject>CURRENTS</subject><subject>ELECTRIC CONDUCTIVITY</subject><subject>EMISSION</subject><subject>GALLIUM NITRIDES</subject><subject>INDIUM COMPOUNDS</subject><subject>Indium gallium nitrides</subject><subject>LIGHT EMITTING DIODES</subject><subject>Mathematical models</subject><subject>Organic light emitting diodes</subject><subject>QUANTUM WELLS</subject><subject>TRAPS</subject><subject>TUNNEL EFFECT</subject><subject>WAVELENGTHS</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNpFkE9LAzEUxIMoWKsHv8GCJw9p85JNsjlK0Voo9VLP4e1utk3ZP-0mi_jt3dKCh-Exw4_HMIQ8A5sBU2IOszQzymh2QybAtKYCILslE8aYoMpIuCcPIRxGK7kQE7LZ9nikGIIP0ZVJHNrW1b7dJb5NVu0SN_NRSRiT2tHTgG0cGvrj6jqp_W4fqWt8jGe-9F3pwiO5q7AO7ul6p-T74327-KTrr-Vq8bamhZAQKYcMDUOnteaIWV5UxglMRW6qXELGHTKT5rmWoCoBnLMyL1EJ5E6WKHkqpuTl8rcL0dtQ-OiKfdGN5YtoOReSZVz-U8e-Ow0uRHvohr4di1kOXMnUSMVG6vVCFX0XQu8qe-x9g_2vBWbPo1qw11HFH50qZ-U</recordid><startdate>20140929</startdate><enddate>20140929</enddate><creator>Auf der Maur, M.</creator><creator>Galler, B.</creator><creator>Pietzonka, I.</creator><creator>Strassburg, M.</creator><creator>Lugauer, H.</creator><creator>Di Carlo, A.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>OTOTI</scope></search><sort><creationdate>20140929</creationdate><title>Trap-assisted tunneling in InGaN/GaN single-quantum-well light-emitting diodes</title><author>Auf der Maur, M. ; Galler, B. ; Pietzonka, I. ; Strassburg, M. ; Lugauer, H. ; Di Carlo, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c351t-218a90ae7772aa8bcf9e3a43b9fb5182ea094bb7516f31220dbda63a2e5da5243</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Applied physics</topic><topic>Computer simulation</topic><topic>COMPUTERIZED SIMULATION</topic><topic>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</topic><topic>CURRENTS</topic><topic>ELECTRIC CONDUCTIVITY</topic><topic>EMISSION</topic><topic>GALLIUM NITRIDES</topic><topic>INDIUM COMPOUNDS</topic><topic>Indium gallium nitrides</topic><topic>LIGHT EMITTING DIODES</topic><topic>Mathematical models</topic><topic>Organic light emitting diodes</topic><topic>QUANTUM WELLS</topic><topic>TRAPS</topic><topic>TUNNEL EFFECT</topic><topic>WAVELENGTHS</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Auf der Maur, M.</creatorcontrib><creatorcontrib>Galler, B.</creatorcontrib><creatorcontrib>Pietzonka, I.</creatorcontrib><creatorcontrib>Strassburg, M.</creatorcontrib><creatorcontrib>Lugauer, H.</creatorcontrib><creatorcontrib>Di Carlo, A.</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Auf der Maur, M.</au><au>Galler, B.</au><au>Pietzonka, I.</au><au>Strassburg, M.</au><au>Lugauer, H.</au><au>Di Carlo, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Trap-assisted tunneling in InGaN/GaN single-quantum-well light-emitting diodes</atitle><jtitle>Applied physics letters</jtitle><date>2014-09-29</date><risdate>2014</risdate><volume>105</volume><issue>13</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>Based on numerical simulation and comparison with measured current characteristics, we show that the current in InGaN/GaN single-quantum-well light-emitting diodes at low forward bias can be accurately described by a standard trap-assisted tunneling model. The qualitative and quantitative differences in the current characteristics of devices with different emission wavelengths are demonstrated to be correlated in a physically consistent way with the tunneling model parameters.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.4896970</doi></addata></record>
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source American Institute of Physics (AIP) Publications; American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)
subjects Applied physics
Computer simulation
COMPUTERIZED SIMULATION
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
CURRENTS
ELECTRIC CONDUCTIVITY
EMISSION
GALLIUM NITRIDES
INDIUM COMPOUNDS
Indium gallium nitrides
LIGHT EMITTING DIODES
Mathematical models
Organic light emitting diodes
QUANTUM WELLS
TRAPS
TUNNEL EFFECT
WAVELENGTHS
title Trap-assisted tunneling in InGaN/GaN single-quantum-well light-emitting diodes
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-05T00%3A41%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Trap-assisted%20tunneling%20in%20InGaN/GaN%20single-quantum-well%20light-emitting%20diodes&rft.jtitle=Applied%20physics%20letters&rft.au=Auf%20der%20Maur,%20M.&rft.date=2014-09-29&rft.volume=105&rft.issue=13&rft.issn=0003-6951&rft.eissn=1077-3118&rft_id=info:doi/10.1063/1.4896970&rft_dat=%3Cproquest_osti_%3E2126549560%3C/proquest_osti_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c351t-218a90ae7772aa8bcf9e3a43b9fb5182ea094bb7516f31220dbda63a2e5da5243%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2126549560&rft_id=info:pmid/&rfr_iscdi=true