Electron-hole recombination on ZnO(0001) single-crystal surface studied by time-resolved soft X-ray photoelectron spectroscopy

Time-resolved soft X-ray photoelectron spectroscopy (PES) experiments were performed with time scales from picoseconds to nanoseconds to trace relaxation of surface photovoltage on the ZnO(0001) single crystal surface in real time. The band diagram of the surface has been obtained numerically using...

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Bibliographic Details
Published in:Applied physics letters 2014-10, Vol.105 (15)
Main Authors: Yukawa, R., Yamamoto, S., Ozawa, K., Emori, M., Ogawa, M., Yamamoto, Sh, Fujikawa, K., Hobara, R., Kitagawa, S., Daimon, H., Sakama, H., Matsuda, I.
Format: Article
Language:English
Subjects:
Applied physics
CARRIER LIFETIME
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Crystal surfaces
Crystals
DEPLETION LAYER
ELECTRONIC STRUCTURE
Electrons
HOLES
Holes (electron deficiencies)
Mathematical models
MONOCRYSTALS
PHOTOELECTRON SPECTROSCOPY
RECOMBINATION
RELAXATION
Single crystals
SOFT X RADIATION
Soft x rays
Spectrum analysis
SURFACES
TIME RESOLUTION
X ray photoelectron spectroscopy
X ray spectra
Zinc oxide
ZINC OXIDES
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Summary:Time-resolved soft X-ray photoelectron spectroscopy (PES) experiments were performed with time scales from picoseconds to nanoseconds to trace relaxation of surface photovoltage on the ZnO(0001) single crystal surface in real time. The band diagram of the surface has been obtained numerically using PES data, showing a depletion layer which extends to 1 μm. Temporal evolution of the photovoltage effect is well explained by a recombination process of a thermionic model, giving the photoexcited carrier lifetime of about 1 ps at the surface under the flat band condition. This lifetime agrees with a temporal range reported by the previous time-resolved optical experiments.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4897934