Model based control of dynamic atomic force microscope

A model-based robust control approach is proposed that significantly improves imaging bandwidth for the dynamic mode atomic force microscopy. A model for cantilever oscillation amplitude and phase dynamics is derived and used for the control design. In particular, the control design is based on a li...

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Bibliographic Details
Published in:Review of scientific instruments 2015-04, Vol.86 (4), p.043703-043703
Main Authors: Lee, Chibum, Salapaka, Srinivasa M
Format: Article
Language:English
Subjects:
AMPLITUDES
ATOMIC FORCE MICROSCOPY
CONTROL THEORY
DESIGN
H-infinity control
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Microscopes
OSCILLATIONS
Robust control
Scientific apparatus & instruments
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Summary:A model-based robust control approach is proposed that significantly improves imaging bandwidth for the dynamic mode atomic force microscopy. A model for cantilever oscillation amplitude and phase dynamics is derived and used for the control design. In particular, the control design is based on a linearized model and robust H(∞) control theory. This design yields a significant improvement when compared to the conventional proportional-integral designs and verified by experiments.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.4917301