On-the-fly scans for X-ray ptychography

With the increasing importance of nanotechnology, the need for reliable real-time imaging of mesoscopic objects with nanometer resolution is rising. For X-ray ptychography, a scanning microscopy technique that provides nanometric resolution on extended fields of view, and the settling time of the sc...

Full description

Saved in:
Bibliographic Details
Published in:Applied physics letters 2014-12, Vol.105 (25)
Main Authors: Pelz, Philipp M., Guizar-Sicairos, Manuel, Thibault, Pierre, Johnson, Ian, Holler, Mirko, Menzel, Andreas
Format: Article
Language:English
Subjects:
Applied physics
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
DIFFRACTION
Diffraction patterns
MICROSCOPY
MIXTURES
NANOSCIENCE AND NANOTECHNOLOGY
NANOSTRUCTURES
NANOTECHNOLOGY
PROBES
RESOLUTION
Scanning microscopy
VELOCITY
X RADIATION
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:With the increasing importance of nanotechnology, the need for reliable real-time imaging of mesoscopic objects with nanometer resolution is rising. For X-ray ptychography, a scanning microscopy technique that provides nanometric resolution on extended fields of view, and the settling time of the scanning system is one of the bottlenecks for fast imaging. Here, we demonstrate that ptychographic on-the-fly scans, i.e., collecting diffraction patterns while the sample is scanned with constant velocity, can be modelled as a state mixture of the probing radiation and allow for reliable image recovery. Characteristics of the probe modes are discussed for various scan parameters, and the application to significantly reducing the scanning time is considered.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4904943