On-the-fly scans for X-ray ptychography

With the increasing importance of nanotechnology, the need for reliable real-time imaging of mesoscopic objects with nanometer resolution is rising. For X-ray ptychography, a scanning microscopy technique that provides nanometric resolution on extended fields of view, and the settling time of the sc...

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Published in:Applied physics letters 2014-12, Vol.105 (25)
Main Authors: Pelz, Philipp M., Guizar-Sicairos, Manuel, Thibault, Pierre, Johnson, Ian, Holler, Mirko, Menzel, Andreas
Format: Article
Language:English
Subjects:
Applied physics
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
DIFFRACTION
Diffraction patterns
MICROSCOPY
MIXTURES
NANOSCIENCE AND NANOTECHNOLOGY
NANOSTRUCTURES
NANOTECHNOLOGY
PROBES
RESOLUTION
Scanning microscopy
VELOCITY
X RADIATION
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cited_by cdi_FETCH-LOGICAL-c386t-89bac6e0f8374efbe583900b35b8c1225f66ebe9a53602771b3fe016b8cf7b733
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container_issue 25
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container_title Applied physics letters
container_volume 105
creator Pelz, Philipp M.
Guizar-Sicairos, Manuel
Thibault, Pierre
Johnson, Ian
Holler, Mirko
Menzel, Andreas
description With the increasing importance of nanotechnology, the need for reliable real-time imaging of mesoscopic objects with nanometer resolution is rising. For X-ray ptychography, a scanning microscopy technique that provides nanometric resolution on extended fields of view, and the settling time of the scanning system is one of the bottlenecks for fast imaging. Here, we demonstrate that ptychographic on-the-fly scans, i.e., collecting diffraction patterns while the sample is scanned with constant velocity, can be modelled as a state mixture of the probing radiation and allow for reliable image recovery. Characteristics of the probe modes are discussed for various scan parameters, and the application to significantly reducing the scanning time is considered.
doi_str_mv 10.1063/1.4904943
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subjects Applied physics
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
DIFFRACTION
Diffraction patterns
MICROSCOPY
MIXTURES
NANOSCIENCE AND NANOTECHNOLOGY
NANOSTRUCTURES
NANOTECHNOLOGY
PROBES
RESOLUTION
Scanning microscopy
VELOCITY
X RADIATION
title On-the-fly scans for X-ray ptychography
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