Large area strain analysis using scanning transmission electron microscopy across multiple images

Here, we apply revolving scanning transmission electron microscopy to measure lattice strain across a sample using a single reference area. To do so, we remove image distortion introduced by sample drift, which usually restricts strain analysis to a single image. Overcoming this challenge, we show t...

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Bibliographic Details
Published in:Applied physics letters 2015-01, Vol.106 (1)
Main Authors: Oni, A. A., Sang, X., Raju, S. V., Dumpala, S., Broderick, S., Kumar, A., Sinnott, S., Saxena, S., Rajan, K., LeBeau, J. M.
Format: Article
Language:English
Subjects:
Applied physics
ATOMS
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
FLUCTUATIONS
Image transmission
Intermetallic phases
Lattice strain
MAPPING
MICROSTRUCTURE
NANOSTRUCTURES
Nickel base alloys
PHASE STUDIES
RESOLUTION
SCANNING ELECTRON MICROSCOPY
Scanning transmission electron microscopy
Strain analysis
STRAINS
Superalloys
TRANSMISSION ELECTRON MICROSCOPY
Unit cell
Variation
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Summary:Here, we apply revolving scanning transmission electron microscopy to measure lattice strain across a sample using a single reference area. To do so, we remove image distortion introduced by sample drift, which usually restricts strain analysis to a single image. Overcoming this challenge, we show that it is possible to use strain reference areas elsewhere in the sample, thereby enabling reliable strain mapping across large areas. As a prototypical example, we determine the strain present within the microstructure of a Ni-based superalloy directly from atom column positions as well as geometric phase analysis. While maintaining atomic resolution, we quantify strain within nanoscale regions and demonstrate that large, unit-cell level strain fluctuations are present within the intermetallic phase.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4905368