Optical modeling and electrical properties of cadmium oxide nanofilms: Developing a meta–heuristic calculation process model

Cadmium oxide thin films were deposited onto glass substrates by sol–gel dip-coating method and annealed in air. The normal incidence transmittance of the films was measured by a spectrophotometer. D.C electrical parameters such as carrier concentration and mobility were analyzed by Hall Effect meas...

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Bibliographic Details
Published in:Journal of applied physics 2015-04, Vol.117 (13)
Main Authors: Abdolahzadeh Ziabari, Ali, Refahi Sheikhani, A. H., Nezafat, Reza Vatani, Haghighidoust, Kasra Monsef
Format: Article
Language:English
Subjects:
ABSORPTION SPECTRA
ALGORITHMS
ANNEALING
Applied physics
Cadmium
CADMIUM OXIDES
Carrier density
CARRIER MOBILITY
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
Computer simulation
COMPUTERIZED SIMULATION
CONCENTRATION RATIO
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
DIP COATING
Dip coatings
ELECTRICAL PROPERTIES
Electromagnetism
Genetic algorithms
Glass substrates
HALL EFFECT
Immersion coating
Mathematical models
Optical properties
Parameters
Particle swarm optimization
Rangefinding
SOL-GEL PROCESS
Sol-gel processes
SPECTROPHOTOMETRY
SUBSTRATES
THIN FILMS
Transmittance
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Summary:Cadmium oxide thin films were deposited onto glass substrates by sol–gel dip-coating method and annealed in air. The normal incidence transmittance of the films was measured by a spectrophotometer. D.C electrical parameters such as carrier concentration and mobility were analyzed by Hall Effect measurements. A combination of Forouhi–Bloomer & standard Drude model was used to simulate the optical constants and thicknesses of the films from transmittance data. The transmittance spectra of the films in the visible domain of wavelengths were successfully fitted by using the result of a hybrid particle swarm optimization method and genetic algorithm. The simulated transmittance is in good accordance with the measured spectrum in the whole measurement wavelength range. The electrical parameters obtained from the optical simulation are well consistent with those measured electrically by Hall Effect measurements.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.4916720