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Distribution of elastic strains appearing in gallium arsenide as a result of doping with isovalent impurities of phosphorus and indium
The distribution of elastic strains in a system consisting of a quantum-dot layer and a buried GaAs x P 1 − x layer is studied using geometric phase analysis. A hypothesis is offered concerning the possibility of controlling the process of the formation of InAs quantum dots in a GaAs matrix using a...
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Published in: | Semiconductors (Woodbury, N.Y.) N.Y.), 2015-01, Vol.49 (1), p.1-3 |
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Main Authors: | , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The distribution of elastic strains in a system consisting of a quantum-dot layer and a buried GaAs
x
P
1 −
x
layer is studied using geometric phase analysis. A hypothesis is offered concerning the possibility of controlling the process of the formation of InAs quantum dots in a GaAs matrix using a local isovalent phosphorus impurity. |
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ISSN: | 1063-7826 1090-6479 |
DOI: | 10.1134/S1063782615010182 |