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Distribution of elastic strains appearing in gallium arsenide as a result of doping with isovalent impurities of phosphorus and indium

The distribution of elastic strains in a system consisting of a quantum-dot layer and a buried GaAs x P 1 − x layer is studied using geometric phase analysis. A hypothesis is offered concerning the possibility of controlling the process of the formation of InAs quantum dots in a GaAs matrix using a...

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Bibliographic Details
Published in:Semiconductors (Woodbury, N.Y.) N.Y.), 2015-01, Vol.49 (1), p.1-3
Main Authors: Pavlov, D. A., Bidus, N. V., Bobrov, A. I., Vikhrova, O. V., Volkova, E. I., Zvonkov, B. N., Malekhonova, N. V., Sorokin, D. S.
Format: Article
Language:English
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Summary:The distribution of elastic strains in a system consisting of a quantum-dot layer and a buried GaAs x P 1 − x layer is studied using geometric phase analysis. A hypothesis is offered concerning the possibility of controlling the process of the formation of InAs quantum dots in a GaAs matrix using a local isovalent phosphorus impurity.
ISSN:1063-7826
1090-6479
DOI:10.1134/S1063782615010182