Simultaneous dynamic electrical and structural measurements of functional materials

A new materials characterization system developed at the XMaS beamline, located at the European Synchrotron Radiation Facility in France, is presented. We show that this new capability allows to measure the atomic structural evolution (crystallography) of piezoelectric materials whilst simultaneousl...

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Bibliographic Details
Published in:Review of scientific instruments 2015-10, Vol.86 (10), p.103901-103901
Main Authors: Vecchini, C, Thompson, P, Stewart, M, Muñiz-Piniella, A, McMitchell, S R C, Wooldridge, J, Lepadatu, S, Bouchenoire, L, Brown, S, Wermeille, D, Bikondoa, O, Lucas, C A, Hase, T P A, Lesourd, M, Dontsov, D, Cain, M G
Format: Article
Language:English
Subjects:
CRYSTALLOGRAPHY
EUROPEAN SYNCHROTRON RADIATION FACILITY
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
MATERIALS
MATERIALS SCIENCE
PIEZOELECTRICITY
Scientific apparatus & instruments
STRAINS
Synchrotron radiation
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Summary:A new materials characterization system developed at the XMaS beamline, located at the European Synchrotron Radiation Facility in France, is presented. We show that this new capability allows to measure the atomic structural evolution (crystallography) of piezoelectric materials whilst simultaneously measuring the overall strain characteristics and electrical response to dynamically (ac) applied external stimuli.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.4931992