Electron beam induced growth of tin whiskers

We have investigated the influence of electron irradiation on tin whisker growth. Sputtered tin samples exposed to electron beam of 6 MeV energy exhibited fast whisker growth, while control samples did not grow any whiskers. The statistics of e-beam induced whiskers was found to follow the log-norma...

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Bibliographic Details
Published in:Journal of applied physics 2015-09, Vol.118 (12)
Main Authors: Vasko, A. C., Warrell, G. R., Parsai, E. I., Karpov, V. G., Shvydka, Diana
Format: Article
Language:English
Subjects:
Accelerated life tests
Accelerated tests
Applied physics
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
DISTRIBUTION
ELECTRON BEAMS
Electron irradiation
IRRADIATION
MEV RANGE 01-10
Normal distribution
SPUTTERING
Statistical analysis
Statistical methods
STATISTICS
SUBSTRATES
Test procedures
TIN
TRAPPING
WHISKERS
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Summary:We have investigated the influence of electron irradiation on tin whisker growth. Sputtered tin samples exposed to electron beam of 6 MeV energy exhibited fast whisker growth, while control samples did not grow any whiskers. The statistics of e-beam induced whiskers was found to follow the log-normal distribution. The observed accelerated whisker growth is attributed to electrostatic effects due to charges trapped in an insulating substrate. These results offer promise for establishing whisker-related accelerated life testing protocols.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.4931426