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Physical properties of a non-transparent cadmium oxide thick film deposited at low fluence by pulsed laser deposition
[Display omitted] •A non-transparent cadmium oxide film has been deposited by pulsed laser deposition.•The CdO film is polycrystalline and highly oriented in the (200) direction.•Thermal treatment was applied in order to see the effect on its physical properties. A stable non-transparent CdO film wa...
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Published in: | Materials research bulletin 2016-04, Vol.76, p.376-383 |
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creator | Quiñones-Galván, J.G. Lozada-Morales, R. Jiménez-Sandoval, S. Camps, Enrique Castrejón-Sánchez, V.H. Campos-González, E. Zapata-Torres, M. Pérez-Centeno, A. Santana-Aranda, M.A. |
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•A non-transparent cadmium oxide film has been deposited by pulsed laser deposition.•The CdO film is polycrystalline and highly oriented in the (200) direction.•Thermal treatment was applied in order to see the effect on its physical properties.
A stable non-transparent CdO film was grown by pulsed laser deposition. The sample was thermally annealed at 500°C in air. A (200) highly oriented polycrystalline film was obtained. The annealed sample has not preferred orientation. Scanning electron micrographs show a grain size reduction for the annealed sample. By Raman spectroscopy, the defects related second order vibrational modes of CdO were observed. Chemical composition analysis shows the presence of CdO together with a substoichiometric CdOx phase for the as-grown sample. For the annealed sample a compensation of oxygen vacancies was observed. Electrical resistivity measurements give a value of 8.602×10−4 (Ωcm) for the as-grown film. For the annealed sample the electrical resistivity increased to a value of 9.996×10−3 (Ωcm). Zero transmission has never been reported for CdO films. The photoluminescence spectra were measured in order to shed some light on the origin of the zero transmission. |
doi_str_mv | 10.1016/j.materresbull.2016.01.002 |
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•A non-transparent cadmium oxide film has been deposited by pulsed laser deposition.•The CdO film is polycrystalline and highly oriented in the (200) direction.•Thermal treatment was applied in order to see the effect on its physical properties.
A stable non-transparent CdO film was grown by pulsed laser deposition. The sample was thermally annealed at 500°C in air. A (200) highly oriented polycrystalline film was obtained. The annealed sample has not preferred orientation. Scanning electron micrographs show a grain size reduction for the annealed sample. By Raman spectroscopy, the defects related second order vibrational modes of CdO were observed. Chemical composition analysis shows the presence of CdO together with a substoichiometric CdOx phase for the as-grown sample. For the annealed sample a compensation of oxygen vacancies was observed. Electrical resistivity measurements give a value of 8.602×10−4 (Ωcm) for the as-grown film. For the annealed sample the electrical resistivity increased to a value of 9.996×10−3 (Ωcm). Zero transmission has never been reported for CdO films. The photoluminescence spectra were measured in order to shed some light on the origin of the zero transmission.</description><identifier>ISSN: 0025-5408</identifier><identifier>EISSN: 1873-4227</identifier><identifier>DOI: 10.1016/j.materresbull.2016.01.002</identifier><language>eng</language><publisher>United States: Elsevier Ltd</publisher><subject>ANNEALING ; CADMIUM OXIDES ; CHEMICAL COMPOSITION ; ELECTRIC CONDUCTIVITY ; EMISSION SPECTRA ; ENERGY BEAM DEPOSITION ; GRAIN ORIENTATION ; GRAIN SIZE ; Laser deposition ; LASER RADIATION ; MATERIALS SCIENCE ; Optical materials ; OPTICAL PROPERTIES ; Oxides ; PHOTOLUMINESCENCE ; POLYCRYSTALS ; PULSED IRRADIATION ; RAMAN SPECTROSCOPY ; VACANCIES ; VISIBLE RADIATION</subject><ispartof>Materials research bulletin, 2016-04, Vol.76, p.376-383</ispartof><rights>2016 Elsevier Ltd</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c352t-7cb0cdac7bd46030af4d3a3fe89421c861195d5e7fa4172e2b2d2abf88c646693</citedby><cites>FETCH-LOGICAL-c352t-7cb0cdac7bd46030af4d3a3fe89421c861195d5e7fa4172e2b2d2abf88c646693</cites><orcidid>0000-0001-7931-3955</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,27924,27925</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/22581514$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Quiñones-Galván, J.G.</creatorcontrib><creatorcontrib>Lozada-Morales, R.</creatorcontrib><creatorcontrib>Jiménez-Sandoval, S.</creatorcontrib><creatorcontrib>Camps, Enrique</creatorcontrib><creatorcontrib>Castrejón-Sánchez, V.H.</creatorcontrib><creatorcontrib>Campos-González, E.</creatorcontrib><creatorcontrib>Zapata-Torres, M.</creatorcontrib><creatorcontrib>Pérez-Centeno, A.</creatorcontrib><creatorcontrib>Santana-Aranda, M.A.</creatorcontrib><title>Physical properties of a non-transparent cadmium oxide thick film deposited at low fluence by pulsed laser deposition</title><title>Materials research bulletin</title><description>[Display omitted]
•A non-transparent cadmium oxide film has been deposited by pulsed laser deposition.•The CdO film is polycrystalline and highly oriented in the (200) direction.•Thermal treatment was applied in order to see the effect on its physical properties.
A stable non-transparent CdO film was grown by pulsed laser deposition. The sample was thermally annealed at 500°C in air. A (200) highly oriented polycrystalline film was obtained. The annealed sample has not preferred orientation. Scanning electron micrographs show a grain size reduction for the annealed sample. By Raman spectroscopy, the defects related second order vibrational modes of CdO were observed. Chemical composition analysis shows the presence of CdO together with a substoichiometric CdOx phase for the as-grown sample. For the annealed sample a compensation of oxygen vacancies was observed. Electrical resistivity measurements give a value of 8.602×10−4 (Ωcm) for the as-grown film. For the annealed sample the electrical resistivity increased to a value of 9.996×10−3 (Ωcm). Zero transmission has never been reported for CdO films. The photoluminescence spectra were measured in order to shed some light on the origin of the zero transmission.</description><subject>ANNEALING</subject><subject>CADMIUM OXIDES</subject><subject>CHEMICAL COMPOSITION</subject><subject>ELECTRIC CONDUCTIVITY</subject><subject>EMISSION SPECTRA</subject><subject>ENERGY BEAM DEPOSITION</subject><subject>GRAIN ORIENTATION</subject><subject>GRAIN SIZE</subject><subject>Laser deposition</subject><subject>LASER RADIATION</subject><subject>MATERIALS SCIENCE</subject><subject>Optical materials</subject><subject>OPTICAL PROPERTIES</subject><subject>Oxides</subject><subject>PHOTOLUMINESCENCE</subject><subject>POLYCRYSTALS</subject><subject>PULSED IRRADIATION</subject><subject>RAMAN SPECTROSCOPY</subject><subject>VACANCIES</subject><subject>VISIBLE RADIATION</subject><issn>0025-5408</issn><issn>1873-4227</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><recordid>eNqNkEtLxDAUhYMoOI7-h6Dr1iRNH-NOxicIutB1SJMbJmPblCRV59-bMgouXV0495z7-BA6pySnhFaX27yXEbyH0E5dl7Ok5YTmhLADtKBNXWScsfoQLZJSZiUnzTE6CWFLCOFNXS_Q9LLZBatkh0fvRvDRQsDOYIkHN2TRyyGM0sMQsZK6t1OP3ZfVgOPGqndsbNdjDaMLNoLGMuLOfWLTTTAowO0Oj1MXUqOTAfyv0brhFB0ZmTpnP3WJ3u5uX9cP2dPz_eP6-ilTRcliVquWKC1V3WpekYJIw3UhCwPNijOqmorSValLqI3ktGbAWqaZbE3TqIpX1apYoov9XBeiFUGlK9VGuWEAFQVjZUNLypPrau9S3oXgwYjR2176naBEzJjFVvzFLGbMglCRoKbwzT4M6Y8PC35eM7-vrZ-3aGf_M-YbDomQMA</recordid><startdate>20160401</startdate><enddate>20160401</enddate><creator>Quiñones-Galván, J.G.</creator><creator>Lozada-Morales, R.</creator><creator>Jiménez-Sandoval, S.</creator><creator>Camps, Enrique</creator><creator>Castrejón-Sánchez, V.H.</creator><creator>Campos-González, E.</creator><creator>Zapata-Torres, M.</creator><creator>Pérez-Centeno, A.</creator><creator>Santana-Aranda, M.A.</creator><general>Elsevier Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope><orcidid>https://orcid.org/0000-0001-7931-3955</orcidid></search><sort><creationdate>20160401</creationdate><title>Physical properties of a non-transparent cadmium oxide thick film deposited at low fluence by pulsed laser deposition</title><author>Quiñones-Galván, J.G. ; Lozada-Morales, R. ; Jiménez-Sandoval, S. ; Camps, Enrique ; Castrejón-Sánchez, V.H. ; Campos-González, E. ; Zapata-Torres, M. ; Pérez-Centeno, A. ; Santana-Aranda, M.A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c352t-7cb0cdac7bd46030af4d3a3fe89421c861195d5e7fa4172e2b2d2abf88c646693</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>ANNEALING</topic><topic>CADMIUM OXIDES</topic><topic>CHEMICAL COMPOSITION</topic><topic>ELECTRIC CONDUCTIVITY</topic><topic>EMISSION SPECTRA</topic><topic>ENERGY BEAM DEPOSITION</topic><topic>GRAIN ORIENTATION</topic><topic>GRAIN SIZE</topic><topic>Laser deposition</topic><topic>LASER RADIATION</topic><topic>MATERIALS SCIENCE</topic><topic>Optical materials</topic><topic>OPTICAL PROPERTIES</topic><topic>Oxides</topic><topic>PHOTOLUMINESCENCE</topic><topic>POLYCRYSTALS</topic><topic>PULSED IRRADIATION</topic><topic>RAMAN SPECTROSCOPY</topic><topic>VACANCIES</topic><topic>VISIBLE RADIATION</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Quiñones-Galván, J.G.</creatorcontrib><creatorcontrib>Lozada-Morales, R.</creatorcontrib><creatorcontrib>Jiménez-Sandoval, S.</creatorcontrib><creatorcontrib>Camps, Enrique</creatorcontrib><creatorcontrib>Castrejón-Sánchez, V.H.</creatorcontrib><creatorcontrib>Campos-González, E.</creatorcontrib><creatorcontrib>Zapata-Torres, M.</creatorcontrib><creatorcontrib>Pérez-Centeno, A.</creatorcontrib><creatorcontrib>Santana-Aranda, M.A.</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Materials research bulletin</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Quiñones-Galván, J.G.</au><au>Lozada-Morales, R.</au><au>Jiménez-Sandoval, S.</au><au>Camps, Enrique</au><au>Castrejón-Sánchez, V.H.</au><au>Campos-González, E.</au><au>Zapata-Torres, M.</au><au>Pérez-Centeno, A.</au><au>Santana-Aranda, M.A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Physical properties of a non-transparent cadmium oxide thick film deposited at low fluence by pulsed laser deposition</atitle><jtitle>Materials research bulletin</jtitle><date>2016-04-01</date><risdate>2016</risdate><volume>76</volume><spage>376</spage><epage>383</epage><pages>376-383</pages><issn>0025-5408</issn><eissn>1873-4227</eissn><abstract>[Display omitted]
•A non-transparent cadmium oxide film has been deposited by pulsed laser deposition.•The CdO film is polycrystalline and highly oriented in the (200) direction.•Thermal treatment was applied in order to see the effect on its physical properties.
A stable non-transparent CdO film was grown by pulsed laser deposition. The sample was thermally annealed at 500°C in air. A (200) highly oriented polycrystalline film was obtained. The annealed sample has not preferred orientation. Scanning electron micrographs show a grain size reduction for the annealed sample. By Raman spectroscopy, the defects related second order vibrational modes of CdO were observed. Chemical composition analysis shows the presence of CdO together with a substoichiometric CdOx phase for the as-grown sample. For the annealed sample a compensation of oxygen vacancies was observed. Electrical resistivity measurements give a value of 8.602×10−4 (Ωcm) for the as-grown film. For the annealed sample the electrical resistivity increased to a value of 9.996×10−3 (Ωcm). Zero transmission has never been reported for CdO films. The photoluminescence spectra were measured in order to shed some light on the origin of the zero transmission.</abstract><cop>United States</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.materresbull.2016.01.002</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0001-7931-3955</orcidid></addata></record> |
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subjects | ANNEALING CADMIUM OXIDES CHEMICAL COMPOSITION ELECTRIC CONDUCTIVITY EMISSION SPECTRA ENERGY BEAM DEPOSITION GRAIN ORIENTATION GRAIN SIZE Laser deposition LASER RADIATION MATERIALS SCIENCE Optical materials OPTICAL PROPERTIES Oxides PHOTOLUMINESCENCE POLYCRYSTALS PULSED IRRADIATION RAMAN SPECTROSCOPY VACANCIES VISIBLE RADIATION |
title | Physical properties of a non-transparent cadmium oxide thick film deposited at low fluence by pulsed laser deposition |
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