Evolution of nanodot morphology on polycarbonate (PC) surfaces by 40 keV Ar

In the present paper we have discussed the effect of 40 keV Ar+ ions irradiation on nanoscale surface morphology of Polycarbonate (PC) substrate. Specimens were sputtered at off normal incidences of 30°, 40° and 50° with the fluence of 1 × 1016 Ar+cm−2. The topographical behaviour of specimens was s...

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Bibliographic Details
Main Authors: Goyal, Meetika, Chawla, Mahak, Gupta, Divya, Shekhawat, Nidhi, Sharma, Annu, Aggarwal, Sanjeev
Format: Conference Proceeding
Language:English
Subjects:
ARGON IONS
ATOMIC FORCE MICROSCOPY
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
COMPUTERIZED SIMULATION
DENSITY
EVOLUTION
INCIDENCE ANGLE
IRRADIATION
KEV RANGE
MORPHOLOGY
NANOSCIENCE AND NANOTECHNOLOGY
Polycarbonate resins
POLYCARBONATES
QUANTUM DOTS
Reinforced reaction injection molding
SPUTTERING
SUBSTRATES
SURFACES
VARIATIONS
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Summary:In the present paper we have discussed the effect of 40 keV Ar+ ions irradiation on nanoscale surface morphology of Polycarbonate (PC) substrate. Specimens were sputtered at off normal incidences of 30°, 40° and 50° with the fluence of 1 × 1016 Ar+cm−2. The topographical behaviour of specimens was studied by using Atomic Force Microscopy (AFM) technique. AFM study demonstrates the evolution of nano dot morphology on PC specimens on irradiating with 1 × 1016 Ar+cm−2. Average size of dots varied from 37-95 nm in this specified range of incidence while density of dots varied from 0.17-3.0 × 107 dotscm−2. Such variations in morphological features have been supported by estimation of ion range and sputtering yield through SRIM simulations.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.4946282