Study of the Structural and Morphological Properties of HPHT Diamond Substrates

The morphological and structural properties of a series of high-pressure high-temperature (HPHT) single-crystal diamond substrates are comprehensively studied by white-light optical interference microscopy, atomic-force microscopy, and X-ray diffraction analysis. Procedures that provide a means for...

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Bibliographic Details
Published in:Semiconductors (Woodbury, N.Y.) N.Y.), 2018-11, Vol.52 (11), p.1432-1436
Main Authors: Yunin, P. A., Volkov, P. V., Drozdov, Yu. N., Koliadin, A. V., Korolev, S. A., Radischev, D. B., Surovegina, E. A., Shashkin, V. I.
Format: Article
Language:English
Subjects:
2018
ATOMIC FORCE MICROSCOPY
CHEMICAL VAPOR DEPOSITION
Crystal structure
DIAMONDS
Epitaxial growth
EPITAXY
Jewelry
LABORATORY EQUIPMENT
Light diffraction
Magnetic Materials
Magnetism
March 12–15
MATERIALS SCIENCE
Microscopy
Morphology
Nizhny Novgorod
Organic chemistry
Physics
Physics and Astronomy
PRESSURE RANGE MEGA PA 10-100
Single crystals
SUBSTRATES
TEMPERATURE RANGE 0400-1000 K
White light
X-RAY DIFFRACTION
Xxii International Symposium “Nanophysics and Nanoelectronics”
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Summary:The morphological and structural properties of a series of high-pressure high-temperature (HPHT) single-crystal diamond substrates are comprehensively studied by white-light optical interference microscopy, atomic-force microscopy, and X-ray diffraction analysis. Procedures that provide a means for characterizing the substrate parameters most critical for epitaxial application with the laboratory equipment are described. It is shown that the jewelry-type characterization of diamond substrates is insufficient to assess the possibility of their use for the epitaxial growth of chemical-vapor-deposited (CVD) diamond.
ISSN:1063-7826
1090-6479
DOI:10.1134/S1063782618110271