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Ion Synthesis: Si–Ge Quantum Dots
We present a method of Si–Ge QDs formation by ion beam implantation (IBI) technique and high temperature annealing for self-organization. Implantation doses varied from 10 14 to 10 17 cm –2 , ion energies ranged from 50 to 150 keV, annealing proceeded at temperature of 950 to 1050°C in argon environ...
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Published in: | Semiconductors (Woodbury, N.Y.) N.Y.), 2018-05, Vol.52 (5), p.625-627 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites |
Online Access: | Get full text |
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Summary: | We present a method of Si–Ge QDs formation by ion beam implantation (IBI) technique and high temperature annealing for self-organization. Implantation doses varied from 10
14
to 10
17
cm
–2
, ion energies ranged from 50 to 150 keV, annealing proceeded at temperature of 950 to 1050°C in argon environment. Formed QDs show strong infrared (IR) photoluminescence (PL) in the temperature region 15–250 K. |
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ISSN: | 1063-7826 1090-6479 |
DOI: | 10.1134/S1063782618050081 |