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Ion Synthesis: Si–Ge Quantum Dots

We present a method of Si–Ge QDs formation by ion beam implantation (IBI) technique and high temperature annealing for self-organization. Implantation doses varied from 10 14 to 10 17 cm –2 , ion energies ranged from 50 to 150 keV, annealing proceeded at temperature of 950 to 1050°C in argon environ...

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Bibliographic Details
Published in:Semiconductors (Woodbury, N.Y.) N.Y.), 2018-05, Vol.52 (5), p.625-627
Main Authors: Gerasimenko, N. N., Balakleyskiy, N. S., Volokhovskiy, A. D., Smirnov, D. I., Zaporozhan, O. A.
Format: Article
Language:English
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Summary:We present a method of Si–Ge QDs formation by ion beam implantation (IBI) technique and high temperature annealing for self-organization. Implantation doses varied from 10 14 to 10 17 cm –2 , ion energies ranged from 50 to 150 keV, annealing proceeded at temperature of 950 to 1050°C in argon environment. Formed QDs show strong infrared (IR) photoluminescence (PL) in the temperature region 15–250 K.
ISSN:1063-7826
1090-6479
DOI:10.1134/S1063782618050081