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Peculiarities of the Properties of III–V Semiconductors in a Multigrain Structure
The systematized results of studies of the properties of InAs, InSb, and GaAs semiconductors in a multigrain structure based on measurement and analysis of the current–voltage and spectral characteristics are presented. It is established that electron emission and injection are determined by the loc...
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Published in: | Semiconductors (Woodbury, N.Y.) N.Y.), 2018-01, Vol.52 (1), p.78-83 |
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container_issue | 1 |
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container_title | Semiconductors (Woodbury, N.Y.) |
container_volume | 52 |
creator | Zhukov, N. D. Kabanov, V. F. Mihaylov, A. I. Mosiyash, D. S. Pereverzev, Ya. E. Hazanov, A. A. Shishkin, M. I. |
description | The systematized results of studies of the properties of InAs, InSb, and GaAs semiconductors in a multigrain structure based on measurement and analysis of the current–voltage and spectral characteristics are presented. It is established that electron emission and injection are determined by the localization effects of states in the bulk and surface region of submicron grains. The phenomena of current limitation and lowfield emission characteristic of quantum dots are revealed and studied. The results can be used in studies and in the development of multigrain structures for gas and optical sensors, detectors, and emitters of infrared and terahertz ranges. |
doi_str_mv | 10.1134/S1063782618010256 |
format | article |
fullrecord | <record><control><sourceid>gale_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_22756183</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><galeid>A529490819</galeid><sourcerecordid>A529490819</sourcerecordid><originalsourceid>FETCH-LOGICAL-c383t-ea821f0d03f564a1ee26957ebf93955d8144e617970f3ab6614d5b92ede863733</originalsourceid><addsrcrecordid>eNp1kc1KJDEQxxtxwY_1Abw1eG43lXTSyVHEj4ERhdnda8ikK2Nk7IxJ-uDNd_ANfZLN0IqCLDlUUvX_hX9VVdUxkFMA1v5aABGsk1SAJEAoFzvVPhBFGtF2and7F6zZ1veqg5QeCAGQvN2vFndox7U30WePqQ6uzvdY38WwwfiRmc1mby-vf-sFPnobhn60OcRU-6E29c24zn4VTXksciyVMeLP6ocz64RH7_Gw-nN58fv8upnfXs3Oz-aNZZLlBo2k4EhPmOOiNYBIheIdLp1iivNeQtuigE51xDGzFALani8VxR5l6ZWxw-pk-jek7HWyPqO9LwYHtFlT2vEyjC-qTQxPI6asH8IYh2JMU0IoZZLKrqhOJ9XKrFH7wYUcjS2nn5pG50v-jFPVKiJBFQAmwMaQUkSnN9E_mvisgejtSvS3lRSGTkwq2mGF8dPK_6F_-SmMHQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2002238287</pqid></control><display><type>article</type><title>Peculiarities of the Properties of III–V Semiconductors in a Multigrain Structure</title><source>Springer Link</source><creator>Zhukov, N. D. ; Kabanov, V. F. ; Mihaylov, A. I. ; Mosiyash, D. S. ; Pereverzev, Ya. E. ; Hazanov, A. A. ; Shishkin, M. I.</creator><creatorcontrib>Zhukov, N. D. ; Kabanov, V. F. ; Mihaylov, A. I. ; Mosiyash, D. S. ; Pereverzev, Ya. E. ; Hazanov, A. A. ; Shishkin, M. I.</creatorcontrib><description>The systematized results of studies of the properties of InAs, InSb, and GaAs semiconductors in a multigrain structure based on measurement and analysis of the current–voltage and spectral characteristics are presented. It is established that electron emission and injection are determined by the localization effects of states in the bulk and surface region of submicron grains. The phenomena of current limitation and lowfield emission characteristic of quantum dots are revealed and studied. The results can be used in studies and in the development of multigrain structures for gas and optical sensors, detectors, and emitters of infrared and terahertz ranges.</description><identifier>ISSN: 1063-7826</identifier><identifier>EISSN: 1090-6479</identifier><identifier>DOI: 10.1134/S1063782618010256</identifier><language>eng</language><publisher>Moscow: Pleiades Publishing</publisher><subject>Composite Semiconductors ; Electromagnetic radiation ; ELECTRON EMISSION ; Electrons ; Emission analysis ; Emissions (Pollution) ; Emissions control ; Emitters ; Emitters (electron) ; Gallium arsenide ; GALLIUM ARSENIDES ; Group III-V semiconductors ; INDIUM ANTIMONIDES ; INDIUM ARSENIDES ; Magnetic Materials ; Magnetism ; MATERIALS SCIENCE ; Microcrystalline ; Nanocrystalline ; NUCLEAR MAGNETIC RESONANCE ; Optical measuring instruments ; Physics ; Physics and Astronomy ; Porous ; QUANTUM DOTS ; SEMICONDUCTOR MATERIALS ; Semiconductors ; Sensors</subject><ispartof>Semiconductors (Woodbury, N.Y.), 2018-01, Vol.52 (1), p.78-83</ispartof><rights>Pleiades Publishing, Ltd. 2018</rights><rights>COPYRIGHT 2018 Springer</rights><rights>Copyright Springer Science & Business Media 2018</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c383t-ea821f0d03f564a1ee26957ebf93955d8144e617970f3ab6614d5b92ede863733</citedby><cites>FETCH-LOGICAL-c383t-ea821f0d03f564a1ee26957ebf93955d8144e617970f3ab6614d5b92ede863733</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,27924,27925</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/22756183$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Zhukov, N. D.</creatorcontrib><creatorcontrib>Kabanov, V. F.</creatorcontrib><creatorcontrib>Mihaylov, A. I.</creatorcontrib><creatorcontrib>Mosiyash, D. S.</creatorcontrib><creatorcontrib>Pereverzev, Ya. E.</creatorcontrib><creatorcontrib>Hazanov, A. A.</creatorcontrib><creatorcontrib>Shishkin, M. I.</creatorcontrib><title>Peculiarities of the Properties of III–V Semiconductors in a Multigrain Structure</title><title>Semiconductors (Woodbury, N.Y.)</title><addtitle>Semiconductors</addtitle><description>The systematized results of studies of the properties of InAs, InSb, and GaAs semiconductors in a multigrain structure based on measurement and analysis of the current–voltage and spectral characteristics are presented. It is established that electron emission and injection are determined by the localization effects of states in the bulk and surface region of submicron grains. The phenomena of current limitation and lowfield emission characteristic of quantum dots are revealed and studied. The results can be used in studies and in the development of multigrain structures for gas and optical sensors, detectors, and emitters of infrared and terahertz ranges.</description><subject>Composite Semiconductors</subject><subject>Electromagnetic radiation</subject><subject>ELECTRON EMISSION</subject><subject>Electrons</subject><subject>Emission analysis</subject><subject>Emissions (Pollution)</subject><subject>Emissions control</subject><subject>Emitters</subject><subject>Emitters (electron)</subject><subject>Gallium arsenide</subject><subject>GALLIUM ARSENIDES</subject><subject>Group III-V semiconductors</subject><subject>INDIUM ANTIMONIDES</subject><subject>INDIUM ARSENIDES</subject><subject>Magnetic Materials</subject><subject>Magnetism</subject><subject>MATERIALS SCIENCE</subject><subject>Microcrystalline</subject><subject>Nanocrystalline</subject><subject>NUCLEAR MAGNETIC RESONANCE</subject><subject>Optical measuring instruments</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Porous</subject><subject>QUANTUM DOTS</subject><subject>SEMICONDUCTOR MATERIALS</subject><subject>Semiconductors</subject><subject>Sensors</subject><issn>1063-7826</issn><issn>1090-6479</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNp1kc1KJDEQxxtxwY_1Abw1eG43lXTSyVHEj4ERhdnda8ikK2Nk7IxJ-uDNd_ANfZLN0IqCLDlUUvX_hX9VVdUxkFMA1v5aABGsk1SAJEAoFzvVPhBFGtF2and7F6zZ1veqg5QeCAGQvN2vFndox7U30WePqQ6uzvdY38WwwfiRmc1mby-vf-sFPnobhn60OcRU-6E29c24zn4VTXksciyVMeLP6ocz64RH7_Gw-nN58fv8upnfXs3Oz-aNZZLlBo2k4EhPmOOiNYBIheIdLp1iivNeQtuigE51xDGzFALani8VxR5l6ZWxw-pk-jek7HWyPqO9LwYHtFlT2vEyjC-qTQxPI6asH8IYh2JMU0IoZZLKrqhOJ9XKrFH7wYUcjS2nn5pG50v-jFPVKiJBFQAmwMaQUkSnN9E_mvisgejtSvS3lRSGTkwq2mGF8dPK_6F_-SmMHQ</recordid><startdate>20180101</startdate><enddate>20180101</enddate><creator>Zhukov, N. D.</creator><creator>Kabanov, V. F.</creator><creator>Mihaylov, A. I.</creator><creator>Mosiyash, D. S.</creator><creator>Pereverzev, Ya. E.</creator><creator>Hazanov, A. A.</creator><creator>Shishkin, M. I.</creator><general>Pleiades Publishing</general><general>Springer</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>20180101</creationdate><title>Peculiarities of the Properties of III–V Semiconductors in a Multigrain Structure</title><author>Zhukov, N. D. ; Kabanov, V. F. ; Mihaylov, A. I. ; Mosiyash, D. S. ; Pereverzev, Ya. E. ; Hazanov, A. A. ; Shishkin, M. I.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c383t-ea821f0d03f564a1ee26957ebf93955d8144e617970f3ab6614d5b92ede863733</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Composite Semiconductors</topic><topic>Electromagnetic radiation</topic><topic>ELECTRON EMISSION</topic><topic>Electrons</topic><topic>Emission analysis</topic><topic>Emissions (Pollution)</topic><topic>Emissions control</topic><topic>Emitters</topic><topic>Emitters (electron)</topic><topic>Gallium arsenide</topic><topic>GALLIUM ARSENIDES</topic><topic>Group III-V semiconductors</topic><topic>INDIUM ANTIMONIDES</topic><topic>INDIUM ARSENIDES</topic><topic>Magnetic Materials</topic><topic>Magnetism</topic><topic>MATERIALS SCIENCE</topic><topic>Microcrystalline</topic><topic>Nanocrystalline</topic><topic>NUCLEAR MAGNETIC RESONANCE</topic><topic>Optical measuring instruments</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Porous</topic><topic>QUANTUM DOTS</topic><topic>SEMICONDUCTOR MATERIALS</topic><topic>Semiconductors</topic><topic>Sensors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhukov, N. D.</creatorcontrib><creatorcontrib>Kabanov, V. F.</creatorcontrib><creatorcontrib>Mihaylov, A. I.</creatorcontrib><creatorcontrib>Mosiyash, D. S.</creatorcontrib><creatorcontrib>Pereverzev, Ya. E.</creatorcontrib><creatorcontrib>Hazanov, A. A.</creatorcontrib><creatorcontrib>Shishkin, M. I.</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Semiconductors (Woodbury, N.Y.)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zhukov, N. D.</au><au>Kabanov, V. F.</au><au>Mihaylov, A. I.</au><au>Mosiyash, D. S.</au><au>Pereverzev, Ya. E.</au><au>Hazanov, A. A.</au><au>Shishkin, M. I.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Peculiarities of the Properties of III–V Semiconductors in a Multigrain Structure</atitle><jtitle>Semiconductors (Woodbury, N.Y.)</jtitle><stitle>Semiconductors</stitle><date>2018-01-01</date><risdate>2018</risdate><volume>52</volume><issue>1</issue><spage>78</spage><epage>83</epage><pages>78-83</pages><issn>1063-7826</issn><eissn>1090-6479</eissn><abstract>The systematized results of studies of the properties of InAs, InSb, and GaAs semiconductors in a multigrain structure based on measurement and analysis of the current–voltage and spectral characteristics are presented. It is established that electron emission and injection are determined by the localization effects of states in the bulk and surface region of submicron grains. The phenomena of current limitation and lowfield emission characteristic of quantum dots are revealed and studied. The results can be used in studies and in the development of multigrain structures for gas and optical sensors, detectors, and emitters of infrared and terahertz ranges.</abstract><cop>Moscow</cop><pub>Pleiades Publishing</pub><doi>10.1134/S1063782618010256</doi><tpages>6</tpages></addata></record> |
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subjects | Composite Semiconductors Electromagnetic radiation ELECTRON EMISSION Electrons Emission analysis Emissions (Pollution) Emissions control Emitters Emitters (electron) Gallium arsenide GALLIUM ARSENIDES Group III-V semiconductors INDIUM ANTIMONIDES INDIUM ARSENIDES Magnetic Materials Magnetism MATERIALS SCIENCE Microcrystalline Nanocrystalline NUCLEAR MAGNETIC RESONANCE Optical measuring instruments Physics Physics and Astronomy Porous QUANTUM DOTS SEMICONDUCTOR MATERIALS Semiconductors Sensors |
title | Peculiarities of the Properties of III–V Semiconductors in a Multigrain Structure |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T12%3A13%3A03IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-gale_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Peculiarities%20of%20the%20Properties%20of%20III%E2%80%93V%20Semiconductors%20in%20a%20Multigrain%20Structure&rft.jtitle=Semiconductors%20(Woodbury,%20N.Y.)&rft.au=Zhukov,%20N.%20D.&rft.date=2018-01-01&rft.volume=52&rft.issue=1&rft.spage=78&rft.epage=83&rft.pages=78-83&rft.issn=1063-7826&rft.eissn=1090-6479&rft_id=info:doi/10.1134/S1063782618010256&rft_dat=%3Cgale_osti_%3EA529490819%3C/gale_osti_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c383t-ea821f0d03f564a1ee26957ebf93955d8144e617970f3ab6614d5b92ede863733%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2002238287&rft_id=info:pmid/&rft_galeid=A529490819&rfr_iscdi=true |