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Peculiarities of the Properties of III–V Semiconductors in a Multigrain Structure

The systematized results of studies of the properties of InAs, InSb, and GaAs semiconductors in a multigrain structure based on measurement and analysis of the current–voltage and spectral characteristics are presented. It is established that electron emission and injection are determined by the loc...

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Published in:Semiconductors (Woodbury, N.Y.) N.Y.), 2018-01, Vol.52 (1), p.78-83
Main Authors: Zhukov, N. D., Kabanov, V. F., Mihaylov, A. I., Mosiyash, D. S., Pereverzev, Ya. E., Hazanov, A. A., Shishkin, M. I.
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cited_by cdi_FETCH-LOGICAL-c383t-ea821f0d03f564a1ee26957ebf93955d8144e617970f3ab6614d5b92ede863733
cites cdi_FETCH-LOGICAL-c383t-ea821f0d03f564a1ee26957ebf93955d8144e617970f3ab6614d5b92ede863733
container_end_page 83
container_issue 1
container_start_page 78
container_title Semiconductors (Woodbury, N.Y.)
container_volume 52
creator Zhukov, N. D.
Kabanov, V. F.
Mihaylov, A. I.
Mosiyash, D. S.
Pereverzev, Ya. E.
Hazanov, A. A.
Shishkin, M. I.
description The systematized results of studies of the properties of InAs, InSb, and GaAs semiconductors in a multigrain structure based on measurement and analysis of the current–voltage and spectral characteristics are presented. It is established that electron emission and injection are determined by the localization effects of states in the bulk and surface region of submicron grains. The phenomena of current limitation and lowfield emission characteristic of quantum dots are revealed and studied. The results can be used in studies and in the development of multigrain structures for gas and optical sensors, detectors, and emitters of infrared and terahertz ranges.
doi_str_mv 10.1134/S1063782618010256
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fullrecord <record><control><sourceid>gale_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_22756183</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><galeid>A529490819</galeid><sourcerecordid>A529490819</sourcerecordid><originalsourceid>FETCH-LOGICAL-c383t-ea821f0d03f564a1ee26957ebf93955d8144e617970f3ab6614d5b92ede863733</originalsourceid><addsrcrecordid>eNp1kc1KJDEQxxtxwY_1Abw1eG43lXTSyVHEj4ERhdnda8ikK2Nk7IxJ-uDNd_ANfZLN0IqCLDlUUvX_hX9VVdUxkFMA1v5aABGsk1SAJEAoFzvVPhBFGtF2and7F6zZ1veqg5QeCAGQvN2vFndox7U30WePqQ6uzvdY38WwwfiRmc1mby-vf-sFPnobhn60OcRU-6E29c24zn4VTXksciyVMeLP6ocz64RH7_Gw-nN58fv8upnfXs3Oz-aNZZLlBo2k4EhPmOOiNYBIheIdLp1iivNeQtuigE51xDGzFALani8VxR5l6ZWxw-pk-jek7HWyPqO9LwYHtFlT2vEyjC-qTQxPI6asH8IYh2JMU0IoZZLKrqhOJ9XKrFH7wYUcjS2nn5pG50v-jFPVKiJBFQAmwMaQUkSnN9E_mvisgejtSvS3lRSGTkwq2mGF8dPK_6F_-SmMHQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2002238287</pqid></control><display><type>article</type><title>Peculiarities of the Properties of III–V Semiconductors in a Multigrain Structure</title><source>Springer Link</source><creator>Zhukov, N. D. ; Kabanov, V. F. ; Mihaylov, A. I. ; Mosiyash, D. S. ; Pereverzev, Ya. E. ; Hazanov, A. A. ; Shishkin, M. I.</creator><creatorcontrib>Zhukov, N. D. ; Kabanov, V. F. ; Mihaylov, A. I. ; Mosiyash, D. S. ; Pereverzev, Ya. E. ; Hazanov, A. A. ; Shishkin, M. I.</creatorcontrib><description>The systematized results of studies of the properties of InAs, InSb, and GaAs semiconductors in a multigrain structure based on measurement and analysis of the current–voltage and spectral characteristics are presented. It is established that electron emission and injection are determined by the localization effects of states in the bulk and surface region of submicron grains. The phenomena of current limitation and lowfield emission characteristic of quantum dots are revealed and studied. The results can be used in studies and in the development of multigrain structures for gas and optical sensors, detectors, and emitters of infrared and terahertz ranges.</description><identifier>ISSN: 1063-7826</identifier><identifier>EISSN: 1090-6479</identifier><identifier>DOI: 10.1134/S1063782618010256</identifier><language>eng</language><publisher>Moscow: Pleiades Publishing</publisher><subject>Composite Semiconductors ; Electromagnetic radiation ; ELECTRON EMISSION ; Electrons ; Emission analysis ; Emissions (Pollution) ; Emissions control ; Emitters ; Emitters (electron) ; Gallium arsenide ; GALLIUM ARSENIDES ; Group III-V semiconductors ; INDIUM ANTIMONIDES ; INDIUM ARSENIDES ; Magnetic Materials ; Magnetism ; MATERIALS SCIENCE ; Microcrystalline ; Nanocrystalline ; NUCLEAR MAGNETIC RESONANCE ; Optical measuring instruments ; Physics ; Physics and Astronomy ; Porous ; QUANTUM DOTS ; SEMICONDUCTOR MATERIALS ; Semiconductors ; Sensors</subject><ispartof>Semiconductors (Woodbury, N.Y.), 2018-01, Vol.52 (1), p.78-83</ispartof><rights>Pleiades Publishing, Ltd. 2018</rights><rights>COPYRIGHT 2018 Springer</rights><rights>Copyright Springer Science &amp; Business Media 2018</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c383t-ea821f0d03f564a1ee26957ebf93955d8144e617970f3ab6614d5b92ede863733</citedby><cites>FETCH-LOGICAL-c383t-ea821f0d03f564a1ee26957ebf93955d8144e617970f3ab6614d5b92ede863733</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,27924,27925</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/22756183$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Zhukov, N. D.</creatorcontrib><creatorcontrib>Kabanov, V. F.</creatorcontrib><creatorcontrib>Mihaylov, A. I.</creatorcontrib><creatorcontrib>Mosiyash, D. S.</creatorcontrib><creatorcontrib>Pereverzev, Ya. E.</creatorcontrib><creatorcontrib>Hazanov, A. A.</creatorcontrib><creatorcontrib>Shishkin, M. I.</creatorcontrib><title>Peculiarities of the Properties of III–V Semiconductors in a Multigrain Structure</title><title>Semiconductors (Woodbury, N.Y.)</title><addtitle>Semiconductors</addtitle><description>The systematized results of studies of the properties of InAs, InSb, and GaAs semiconductors in a multigrain structure based on measurement and analysis of the current–voltage and spectral characteristics are presented. It is established that electron emission and injection are determined by the localization effects of states in the bulk and surface region of submicron grains. The phenomena of current limitation and lowfield emission characteristic of quantum dots are revealed and studied. The results can be used in studies and in the development of multigrain structures for gas and optical sensors, detectors, and emitters of infrared and terahertz ranges.</description><subject>Composite Semiconductors</subject><subject>Electromagnetic radiation</subject><subject>ELECTRON EMISSION</subject><subject>Electrons</subject><subject>Emission analysis</subject><subject>Emissions (Pollution)</subject><subject>Emissions control</subject><subject>Emitters</subject><subject>Emitters (electron)</subject><subject>Gallium arsenide</subject><subject>GALLIUM ARSENIDES</subject><subject>Group III-V semiconductors</subject><subject>INDIUM ANTIMONIDES</subject><subject>INDIUM ARSENIDES</subject><subject>Magnetic Materials</subject><subject>Magnetism</subject><subject>MATERIALS SCIENCE</subject><subject>Microcrystalline</subject><subject>Nanocrystalline</subject><subject>NUCLEAR MAGNETIC RESONANCE</subject><subject>Optical measuring instruments</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Porous</subject><subject>QUANTUM DOTS</subject><subject>SEMICONDUCTOR MATERIALS</subject><subject>Semiconductors</subject><subject>Sensors</subject><issn>1063-7826</issn><issn>1090-6479</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNp1kc1KJDEQxxtxwY_1Abw1eG43lXTSyVHEj4ERhdnda8ikK2Nk7IxJ-uDNd_ANfZLN0IqCLDlUUvX_hX9VVdUxkFMA1v5aABGsk1SAJEAoFzvVPhBFGtF2and7F6zZ1veqg5QeCAGQvN2vFndox7U30WePqQ6uzvdY38WwwfiRmc1mby-vf-sFPnobhn60OcRU-6E29c24zn4VTXksciyVMeLP6ocz64RH7_Gw-nN58fv8upnfXs3Oz-aNZZLlBo2k4EhPmOOiNYBIheIdLp1iivNeQtuigE51xDGzFALani8VxR5l6ZWxw-pk-jek7HWyPqO9LwYHtFlT2vEyjC-qTQxPI6asH8IYh2JMU0IoZZLKrqhOJ9XKrFH7wYUcjS2nn5pG50v-jFPVKiJBFQAmwMaQUkSnN9E_mvisgejtSvS3lRSGTkwq2mGF8dPK_6F_-SmMHQ</recordid><startdate>20180101</startdate><enddate>20180101</enddate><creator>Zhukov, N. D.</creator><creator>Kabanov, V. F.</creator><creator>Mihaylov, A. I.</creator><creator>Mosiyash, D. S.</creator><creator>Pereverzev, Ya. E.</creator><creator>Hazanov, A. A.</creator><creator>Shishkin, M. I.</creator><general>Pleiades Publishing</general><general>Springer</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>20180101</creationdate><title>Peculiarities of the Properties of III–V Semiconductors in a Multigrain Structure</title><author>Zhukov, N. D. ; Kabanov, V. F. ; Mihaylov, A. I. ; Mosiyash, D. S. ; Pereverzev, Ya. E. ; Hazanov, A. A. ; Shishkin, M. I.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c383t-ea821f0d03f564a1ee26957ebf93955d8144e617970f3ab6614d5b92ede863733</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Composite Semiconductors</topic><topic>Electromagnetic radiation</topic><topic>ELECTRON EMISSION</topic><topic>Electrons</topic><topic>Emission analysis</topic><topic>Emissions (Pollution)</topic><topic>Emissions control</topic><topic>Emitters</topic><topic>Emitters (electron)</topic><topic>Gallium arsenide</topic><topic>GALLIUM ARSENIDES</topic><topic>Group III-V semiconductors</topic><topic>INDIUM ANTIMONIDES</topic><topic>INDIUM ARSENIDES</topic><topic>Magnetic Materials</topic><topic>Magnetism</topic><topic>MATERIALS SCIENCE</topic><topic>Microcrystalline</topic><topic>Nanocrystalline</topic><topic>NUCLEAR MAGNETIC RESONANCE</topic><topic>Optical measuring instruments</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Porous</topic><topic>QUANTUM DOTS</topic><topic>SEMICONDUCTOR MATERIALS</topic><topic>Semiconductors</topic><topic>Sensors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhukov, N. D.</creatorcontrib><creatorcontrib>Kabanov, V. F.</creatorcontrib><creatorcontrib>Mihaylov, A. I.</creatorcontrib><creatorcontrib>Mosiyash, D. S.</creatorcontrib><creatorcontrib>Pereverzev, Ya. E.</creatorcontrib><creatorcontrib>Hazanov, A. A.</creatorcontrib><creatorcontrib>Shishkin, M. I.</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Semiconductors (Woodbury, N.Y.)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zhukov, N. D.</au><au>Kabanov, V. F.</au><au>Mihaylov, A. I.</au><au>Mosiyash, D. S.</au><au>Pereverzev, Ya. E.</au><au>Hazanov, A. A.</au><au>Shishkin, M. I.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Peculiarities of the Properties of III–V Semiconductors in a Multigrain Structure</atitle><jtitle>Semiconductors (Woodbury, N.Y.)</jtitle><stitle>Semiconductors</stitle><date>2018-01-01</date><risdate>2018</risdate><volume>52</volume><issue>1</issue><spage>78</spage><epage>83</epage><pages>78-83</pages><issn>1063-7826</issn><eissn>1090-6479</eissn><abstract>The systematized results of studies of the properties of InAs, InSb, and GaAs semiconductors in a multigrain structure based on measurement and analysis of the current–voltage and spectral characteristics are presented. It is established that electron emission and injection are determined by the localization effects of states in the bulk and surface region of submicron grains. The phenomena of current limitation and lowfield emission characteristic of quantum dots are revealed and studied. The results can be used in studies and in the development of multigrain structures for gas and optical sensors, detectors, and emitters of infrared and terahertz ranges.</abstract><cop>Moscow</cop><pub>Pleiades Publishing</pub><doi>10.1134/S1063782618010256</doi><tpages>6</tpages></addata></record>
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subjects Composite Semiconductors
Electromagnetic radiation
ELECTRON EMISSION
Electrons
Emission analysis
Emissions (Pollution)
Emissions control
Emitters
Emitters (electron)
Gallium arsenide
GALLIUM ARSENIDES
Group III-V semiconductors
INDIUM ANTIMONIDES
INDIUM ARSENIDES
Magnetic Materials
Magnetism
MATERIALS SCIENCE
Microcrystalline
Nanocrystalline
NUCLEAR MAGNETIC RESONANCE
Optical measuring instruments
Physics
Physics and Astronomy
Porous
QUANTUM DOTS
SEMICONDUCTOR MATERIALS
Semiconductors
Sensors
title Peculiarities of the Properties of III–V Semiconductors in a Multigrain Structure
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T12%3A13%3A03IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-gale_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Peculiarities%20of%20the%20Properties%20of%20III%E2%80%93V%20Semiconductors%20in%20a%20Multigrain%20Structure&rft.jtitle=Semiconductors%20(Woodbury,%20N.Y.)&rft.au=Zhukov,%20N.%20D.&rft.date=2018-01-01&rft.volume=52&rft.issue=1&rft.spage=78&rft.epage=83&rft.pages=78-83&rft.issn=1063-7826&rft.eissn=1090-6479&rft_id=info:doi/10.1134/S1063782618010256&rft_dat=%3Cgale_osti_%3EA529490819%3C/gale_osti_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c383t-ea821f0d03f564a1ee26957ebf93955d8144e617970f3ab6614d5b92ede863733%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2002238287&rft_id=info:pmid/&rft_galeid=A529490819&rfr_iscdi=true