Double-Crystal Rocking Curve Simulation Using 2D Spectral Angular Diagrams of X-Ray Radiation

A new approach to numerical simulation of double-crystal rocking curves is proposed. This approach is based on the use of experimental spectral angular diagrams of X-ray intensity distribution. Special calculation algorithms, which take into account the instrumental function of X-ray diffractometer...

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Bibliographic Details
Published in:Crystallography reports 2018-07, Vol.63 (4), p.521-530
Main Authors: Atknin, I. I., Marchenkov, N. V., Chukhovskii, F. N., Blagov, A. E., Kovalchuk, M. V.
Format: Article
Language:English
Subjects:
Adequacy
ALGORITHMS
ANODES
ASYMMETRY
BRAGG REFLECTION
COMPARATIVE EVALUATIONS
Computer simulation
COMPUTERIZED SIMULATION
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Crystallography and Scattering Methods
CRYSTALS
DIAGRAMS
Diffraction and Scattering of Ionizing Radiations
Diffraction patterns
DISPERSIONS
DISTRIBUTION
Mathematical analysis
MONOCHROMATORS
NEUTRON DIFFRACTION
Optical components
Physics
Physics and Astronomy
Radiation sources
Simulation
Slits
Spectra
Synchrotron radiation
SYNCHROTRON RADIATION SOURCES
X ray tubes
X-ray diffraction
X-RAY DIFFRACTOMETERS
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Summary:A new approach to numerical simulation of double-crystal rocking curves is proposed. This approach is based on the use of experimental spectral angular diagrams of X-ray intensity distribution. Special calculation algorithms, which take into account the instrumental function of X-ray diffractometer and possible effects of dispersion and Bragg reflection asymmetry, have been developed and applied. A specific feature of the proposed approach is the possibility of visualizing the 2D spectral angular diagram of X-ray beam after its interaction with each element of the scheme. The approach makes it possible to perform calculations for a wide range of radiation sources (from an X-ray tube with any anode to a synchrotron radiation source) and X-ray optical elements (slits and monochromators). A comparison of simulation results and experimental data for a Si(110) crystal sample has confirmed adequacy of the proposed approach and its applicability for simulating diffraction patterns recorded in real experiments.
ISSN:1063-7745
1562-689X
DOI:10.1134/S1063774518040041