Low-voltage scanning electron microscopy of multilayer polymer systems

The possibilities of low-voltage scanning electron microscopy for visualization of specific features of the microstructure in internal layers of multilayer polymer films are demonstrated by the example of “chitosan–polyelectrolyte complex–alginic acid” composite. The process of electron beam interac...

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Bibliographic Details
Published in:Crystallography reports 2017-09, Vol.62 (5), p.710-715
Main Authors: Orekhov, A. S., Klechkovskaya, V. V., Kononova, S. V.
Format: Article
Language:English
Subjects:
ALGINIC ACID
AMINO ACIDS
Chitosan
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Crystallography and Scattering Methods
ELECTRIC POTENTIAL
ELECTRON BEAMS
Electron microscopes
LAYERS
MICROSTRUCTURE
OLIGOSACCHARIDES
Physics
Physics and Astronomy
Polyelectrolytes
Polymer films
POLYMERS
RESOLUTION
SCANNING ELECTRON MICROSCOPY
Structure of Organic Compounds
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Summary:The possibilities of low-voltage scanning electron microscopy for visualization of specific features of the microstructure in internal layers of multilayer polymer films are demonstrated by the example of “chitosan–polyelectrolyte complex–alginic acid” composite. The process of electron beam interaction with a sample at low electron energies is considered. The key parameters of low-voltage electron microscopy, which make it possible to increase the resolution of SEM images of polymer systems, are discussed.
ISSN:1063-7745
1562-689X
DOI:10.1134/S1063774517050145