New Applications of Langmuir Probes

In this work, two new possibilities for standard probe diagnostics are described. The first one can be used to study isotropic, collisionless low-pressure plasma in which the electron energy distribution function is close to a Maxwellian one. In such plasmas, the Boltzmann law, Bohm effect, and 3/2...

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Bibliographic Details
Published in:Physics of atomic nuclei 2017-12, Vol.80 (11), p.1697-1700
Main Authors: Masherov, P. E., Piskunkov, A. F., Riaby, V. A., Savinov, V. P., Yakunin, V. G.
Format: Article
Language:English
Subjects:
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
CURRENT DENSITY
CYLINDRICAL CONFIGURATION
DISTRIBUTION FUNCTIONS
Electron energy
Electron energy distribution
ELECTRONS
ENERGY SPECTRA
Gas Discharge and Plasma Physics
GRIDS
Investigations
Ion current density
Ion extraction
ION SOURCES
IONS
LANGMUIR PROBE
Laws, regulations and rules
Legal issues
Particle and Nuclear Physics
Physics
Physics and Astronomy
PLASMA PRESSURE
Plasmas
Probability distributions
SIMULATORS
Temperature measurement
THICKNESS
WALLS
XENON
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Summary:In this work, two new possibilities for standard probe diagnostics are described. The first one can be used to study isotropic, collisionless low-pressure plasma in which the electron energy distribution function is close to a Maxwellian one. In such plasmas, the Boltzmann law, Bohm effect, and 3/2 power law are valid. Use of corresponding system of equations for cylindrical Langmuir probes allowed for measurements of probe sheath thicknesses and the mean ion mass. The solution of this task was provided by accurate probe diagnostics of inductive xenon plasma at pressure p = 2 mTorr that resulted in the determination of the Bohm coefficient C BCyl = 1.22. The second possibility of probe diagnostics includes a method and device for evaluation of ion current density to a wall under a floating potential using a radially movable plane wall Langmuir probe simulator. This measurement in the same xenon plasma served as the basis for development of an ion source in which the given wall was represented by an ion extracting electrode of the ion extraction grid system.
ISSN:1063-7788
1562-692X
DOI:10.1134/S1063778817110114