Effect of the Crystal Structure on the Electrical Properties of Thin-Film PZT Structures

A new method of two-stage crystallization of lead zirconate–titanate (PZT) films using a seed sublayer with a low excess lead content has been proposed and realized. A seed layer with a strong texture of perovskite Pe(111) grains is formed from a solution with a lead excess of 0–5 wt %; the fast gro...

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Bibliographic Details
Published in:Physics of the solid state 2018-03, Vol.60 (3), p.553-558
Main Authors: Delimova, L. A., Gushchina, E. V., Zaitseva, N. V., Seregin, D. S., Vorotilov, K. A., Sigov, A. S.
Format: Article
Language:English
Subjects:
Analysis
ATOMIC FORCE MICROSCOPY
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
CRYSTAL STRUCTURE
CRYSTALLIZATION
DEPOSITION
DISTRIBUTION
Electric contacts
ELECTRIC POTENTIAL
Electric properties
ELECTRICAL PROPERTIES
Ferroelectricity
Grains
INTERFACES
LAYERS
Lead zirconate titanates
Percolation
PEROVSKITE
Perovskites
Physics
Physics and Astronomy
PZT
Solid State Physics
TEXTURE
THIN FILMS
Transient current
TRANSIENTS
TRAPS
Zirconium
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Summary:A new method of two-stage crystallization of lead zirconate–titanate (PZT) films using a seed sublayer with a low excess lead content has been proposed and realized. A seed layer with a strong texture of perovskite Pe(111) grains is formed from a solution with a lead excess of 0–5 wt %; the fast growth of the grains is provided by the deposition of the main film from a solution with high lead content. As a result, a strong Pe(111) texture with complete suppression of the Pe(100) orientation forms. An analysis of current–voltage dependences of the transient currents and the distributions of the local conductivity measured by the contact AFM method reveals two various mechanisms of current percolation that are determined by traps in the bulk and at the perovskite grain interfaces.
ISSN:1063-7834
1090-6460
DOI:10.1134/S1063783418030058