Localization of the Wannier–Mott Exciton on a Langmuir-Film/CdS Organic Semiconductor Interface

The low-temperature ( T = 2 K) light reflectance spectra of organic semiconductor structures produced by depositing Langmuir–Blodgett films on a cadmium sulfide (CdS) crystal surface are studied. The spectra were studied in the region of the resonant frequency of the exciton state A n   = 1 in CdS....

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Bibliographic Details
Published in:Physics of the solid state 2019-07, Vol.61 (7), p.1304-1309
Main Authors: Korolkova, K. A., Novak, V. R., Sel’kin, A. V.
Format: Article
Language:English
Subjects:
Analysis
Cadmium sulfide
CADMIUM SULFIDES
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Crystal surfaces
CRYSTALS
DEPOSITION
EXCITONS
Langmuir-Blodgett films
Localization
Multilayers
ORGANIC SEMICONDUCTORS
Physics
Physics and Astronomy
Reflectance
Resonant frequencies
Semiconductor crystals
Solid State Physics
SPECTRA
Sulfides
Surface Physics and Thin Films
SURFACES
TEMPERATURE RANGE 0065-0273 K
THIN FILMS
VISIBLE RADIATION
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Summary:The low-temperature ( T = 2 K) light reflectance spectra of organic semiconductor structures produced by depositing Langmuir–Blodgett films on a cadmium sulfide (CdS) crystal surface are studied. The spectra were studied in the region of the resonant frequency of the exciton state A n   = 1 in CdS. The spectra were analyzed within a multilayer medium model with allowance for the spatial dispersion and an exciton-free “dead” layer near the crystal surface contacting with the film. A conclusion is made that, as a result of the deposition of an organic film on a semiconductor crystal surface, the Wanier–Mott exciton is spatially localized near the film–crystal interface.
ISSN:1063-7834
1090-6460
DOI:10.1134/S1063783419070175