Current-modulating magnetic force microscope probe

A new current-modulating probe for the magnetic force microscope (MFM) is proposed in this article. The magnetic field, which will be used to interact with a magnetic specimen’s stray field, is induced on the sharp tip of the conical magnetic core surrounded by a microfabricated single turn conducti...

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Published in:Journal of applied physics 2001-06, Vol.89 (11), p.6778-6780
Main Authors: Wang, Frank Z., Helian, Na, Clegg, Warwick W, Windmill, James F. C., Jenkins, David
Format: Article
Language:English
Subjects:
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
MAGNETIC CORES
MAGNETIC FIELDS
MICROSCOPES
PHYSICS
PROBES
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container_end_page 6780
container_issue 11
container_start_page 6778
container_title Journal of applied physics
container_volume 89
creator Wang, Frank Z.
Helian, Na
Clegg, Warwick W
Windmill, James F. C.
Jenkins, David
description A new current-modulating probe for the magnetic force microscope (MFM) is proposed in this article. The magnetic field, which will be used to interact with a magnetic specimen’s stray field, is induced on the sharp tip of the conical magnetic core surrounded by a microfabricated single turn conductive coil. The reciprocity principle is used to obtain the force acting on the probe due to the specimen’s stray field when scanned over a magnetic specimen. The magnetic field intensity is adjustable by control of the applied current. Images of specimens have been modeled using this probe. The suitability to different specimens is seen to be the biggest advantage of this scheme over the conventional probe designs.
doi_str_mv 10.1063/1.1358817
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source American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)
subjects CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
MAGNETIC CORES
MAGNETIC FIELDS
MICROSCOPES
PHYSICS
PROBES
title Current-modulating magnetic force microscope probe
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