Voltage required to detach an adhered particle by Coulomb interaction for micromanipulation

An adhered particle can be detached by Coulomb interaction. The voltage required for detachment for micromanipulation is theoretically analyzed by employment of a boundary element method. The system consists of a manipulating probe, a spherical particle, and a substrate plate, all of these objects b...

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Bibliographic Details
Published in:Journal of applied physics 2001-07, Vol.90 (1), p.432-437
Main Authors: Takahashi, Kunio, Kajihara, Hideaki, Urago, Masataka, Saito, Shigeki, Mochimaru, Yoshihiro, Onzawa, Tadao
Format: Article
Language:English
Subjects:
ADHESION
AXIAL SYMMETRY
BOUNDARY ELEMENT METHOD
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
EMPLOYMENT
MANIPULATORS
PHYSICS
SHAPE
SUBSTRATES
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Summary:An adhered particle can be detached by Coulomb interaction. The voltage required for detachment for micromanipulation is theoretically analyzed by employment of a boundary element method. The system consists of a manipulating probe, a spherical particle, and a substrate plate, all of these objects being conductive. The manipulator and the substrate are cylindrical, and axial symmetry is assumed. Although a numerical method is used to solve the equations, all parameters are normalized. The effect of the shape parameters on the Coulomb force is systematically calculated. The force is independent of system size and depends on the relative shape of the system. The force is proportional to the applied voltage raised to the second power. The force generated by the Coulomb interaction is compared with the adhesion force deduced from the Johnson–Kendall–Roberts theory, and the voltage required for detachment is clearly expressed. The possibilities and limitations of micromanipulation using both the adhesion phenomenon and Coulomb interaction are theoretically discussed.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.1379353