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X-ray backlighting for the National Ignition Facility (invited)
X-ray backlighting is a powerful tool for diagnosing a large variety of high-density phenomena. Traditional area backlighting techniques used at Nova and Omega cannot be extended efficiently to National Ignition Facility scale. New, more efficient backlighting sources and techniques are required and...
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| Published in: | Review of Scientific Instruments 2001-01, Vol.72 (1), p.627-634 |
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| Main Authors: | , , , , , , , , , , |
| Format: | Article |
| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c426t-4cdf785214fdb719dc6d916bfe08412f774e3ce46de1b38bf0b077e2fa3ac9203 |
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| cites | cdi_FETCH-LOGICAL-c426t-4cdf785214fdb719dc6d916bfe08412f774e3ce46de1b38bf0b077e2fa3ac9203 |
| container_end_page | 634 |
| container_issue | 1 |
| container_start_page | 627 |
| container_title | Review of Scientific Instruments |
| container_volume | 72 |
| creator | Landen, O. L. Farley, D. R. Glendinning, S. G. Logory, L. M. Bell, P. M. Koch, J. A. Lee, F. D. Bradley, D. K. Kalantar, D. H. Back, C. A. Turner, R. E. |
| description | X-ray backlighting is a powerful tool for diagnosing a large variety of high-density phenomena. Traditional area backlighting techniques used at Nova and Omega cannot be extended efficiently to National Ignition Facility scale. New, more efficient backlighting sources and techniques are required and have begun to show promising results. These include a backlit-pinhole point-projection technique, pinhole and slit arrays, distributed polychromatic sources, and picket-fence backlighters. In parallel, there have been developments in improving the data signal-to-noise and, hence, quality by switching from film to charge-coupled-device-based recording media and by removing the fixed-pattern noise of microchannel-plate-based cameras. |
| doi_str_mv | 10.1063/1.1315641 |
| format | article |
| fullrecord | <record><control><sourceid>scitation_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_40204853</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>rsi</sourcerecordid><originalsourceid>FETCH-LOGICAL-c426t-4cdf785214fdb719dc6d916bfe08412f774e3ce46de1b38bf0b077e2fa3ac9203</originalsourceid><addsrcrecordid>eNp90MFKAzEQBuAgCtbqwTcIeLHC1kySTXZPIqXVQtGLgreQzSZtdN0tSSj07d3aogfBucwcPv5hBqFLIGMggt3CGBjkgsMRGgApykwKyo7RgBDGMyF5cYrOYnwnfeUAA3T3lgW9xZU2H41frpJvl9h1AaeVxU86-a7VDZ4vW78b8Uwb3_i0xde-3fhk69E5OnG6ifbi0IfodTZ9mTxmi-eH-eR-kRlORcq4qZ0scgrc1ZWEsjaiLkFUzpKCA3VScsuM5aK2ULGicqQiUlrqNNOmpIQN0dU-t4vJq2j65WZlura1JilOKOFFzno12isTuhiDdWod_KcOWwVE7f6jQB3-09ubvd2FfV_6gzdd-IVqXbv_8N_kL-wKcog</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>X-ray backlighting for the National Ignition Facility (invited)</title><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><source>AIP - American Institute of Physics</source><creator>Landen, O. L. ; Farley, D. R. ; Glendinning, S. G. ; Logory, L. M. ; Bell, P. M. ; Koch, J. A. ; Lee, F. D. ; Bradley, D. K. ; Kalantar, D. H. ; Back, C. A. ; Turner, R. E.</creator><creatorcontrib>Landen, O. L. ; Farley, D. R. ; Glendinning, S. G. ; Logory, L. M. ; Bell, P. M. ; Koch, J. A. ; Lee, F. D. ; Bradley, D. K. ; Kalantar, D. H. ; Back, C. A. ; Turner, R. E.</creatorcontrib><description>X-ray backlighting is a powerful tool for diagnosing a large variety of high-density phenomena. Traditional area backlighting techniques used at Nova and Omega cannot be extended efficiently to National Ignition Facility scale. New, more efficient backlighting sources and techniques are required and have begun to show promising results. These include a backlit-pinhole point-projection technique, pinhole and slit arrays, distributed polychromatic sources, and picket-fence backlighters. In parallel, there have been developments in improving the data signal-to-noise and, hence, quality by switching from film to charge-coupled-device-based recording media and by removing the fixed-pattern noise of microchannel-plate-based cameras.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1315641</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><publisher>United States: The American Physical Society</publisher><subject>70 PLASMA PHYSICS AND FUSION TECHNOLOGY ; CAMERAS ; PHYSICS ; US NATIONAL IGNITION FACILITY</subject><ispartof>Review of Scientific Instruments, 2001-01, Vol.72 (1), p.627-634</ispartof><rights>American Institute of Physics</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c426t-4cdf785214fdb719dc6d916bfe08412f774e3ce46de1b38bf0b077e2fa3ac9203</citedby><cites>FETCH-LOGICAL-c426t-4cdf785214fdb719dc6d916bfe08412f774e3ce46de1b38bf0b077e2fa3ac9203</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.1315641$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>230,309,310,314,780,782,784,789,790,795,885,23930,23931,25140,27924,27925,76383</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/40204853$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Landen, O. L.</creatorcontrib><creatorcontrib>Farley, D. R.</creatorcontrib><creatorcontrib>Glendinning, S. G.</creatorcontrib><creatorcontrib>Logory, L. M.</creatorcontrib><creatorcontrib>Bell, P. M.</creatorcontrib><creatorcontrib>Koch, J. A.</creatorcontrib><creatorcontrib>Lee, F. D.</creatorcontrib><creatorcontrib>Bradley, D. K.</creatorcontrib><creatorcontrib>Kalantar, D. H.</creatorcontrib><creatorcontrib>Back, C. A.</creatorcontrib><creatorcontrib>Turner, R. E.</creatorcontrib><title>X-ray backlighting for the National Ignition Facility (invited)</title><title>Review of Scientific Instruments</title><description>X-ray backlighting is a powerful tool for diagnosing a large variety of high-density phenomena. Traditional area backlighting techniques used at Nova and Omega cannot be extended efficiently to National Ignition Facility scale. New, more efficient backlighting sources and techniques are required and have begun to show promising results. These include a backlit-pinhole point-projection technique, pinhole and slit arrays, distributed polychromatic sources, and picket-fence backlighters. In parallel, there have been developments in improving the data signal-to-noise and, hence, quality by switching from film to charge-coupled-device-based recording media and by removing the fixed-pattern noise of microchannel-plate-based cameras.</description><subject>70 PLASMA PHYSICS AND FUSION TECHNOLOGY</subject><subject>CAMERAS</subject><subject>PHYSICS</subject><subject>US NATIONAL IGNITION FACILITY</subject><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><recordid>eNp90MFKAzEQBuAgCtbqwTcIeLHC1kySTXZPIqXVQtGLgreQzSZtdN0tSSj07d3aogfBucwcPv5hBqFLIGMggt3CGBjkgsMRGgApykwKyo7RgBDGMyF5cYrOYnwnfeUAA3T3lgW9xZU2H41frpJvl9h1AaeVxU86-a7VDZ4vW78b8Uwb3_i0xde-3fhk69E5OnG6ifbi0IfodTZ9mTxmi-eH-eR-kRlORcq4qZ0scgrc1ZWEsjaiLkFUzpKCA3VScsuM5aK2ULGicqQiUlrqNNOmpIQN0dU-t4vJq2j65WZlura1JilOKOFFzno12isTuhiDdWod_KcOWwVE7f6jQB3-09ubvd2FfV_6gzdd-IVqXbv_8N_kL-wKcog</recordid><startdate>200101</startdate><enddate>200101</enddate><creator>Landen, O. L.</creator><creator>Farley, D. R.</creator><creator>Glendinning, S. G.</creator><creator>Logory, L. M.</creator><creator>Bell, P. M.</creator><creator>Koch, J. A.</creator><creator>Lee, F. D.</creator><creator>Bradley, D. K.</creator><creator>Kalantar, D. H.</creator><creator>Back, C. A.</creator><creator>Turner, R. E.</creator><general>The American Physical Society</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>200101</creationdate><title>X-ray backlighting for the National Ignition Facility (invited)</title><author>Landen, O. L. ; Farley, D. R. ; Glendinning, S. G. ; Logory, L. M. ; Bell, P. M. ; Koch, J. A. ; Lee, F. D. ; Bradley, D. K. ; Kalantar, D. H. ; Back, C. A. ; Turner, R. E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c426t-4cdf785214fdb719dc6d916bfe08412f774e3ce46de1b38bf0b077e2fa3ac9203</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>70 PLASMA PHYSICS AND FUSION TECHNOLOGY</topic><topic>CAMERAS</topic><topic>PHYSICS</topic><topic>US NATIONAL IGNITION FACILITY</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Landen, O. L.</creatorcontrib><creatorcontrib>Farley, D. R.</creatorcontrib><creatorcontrib>Glendinning, S. G.</creatorcontrib><creatorcontrib>Logory, L. M.</creatorcontrib><creatorcontrib>Bell, P. M.</creatorcontrib><creatorcontrib>Koch, J. A.</creatorcontrib><creatorcontrib>Lee, F. D.</creatorcontrib><creatorcontrib>Bradley, D. K.</creatorcontrib><creatorcontrib>Kalantar, D. H.</creatorcontrib><creatorcontrib>Back, C. A.</creatorcontrib><creatorcontrib>Turner, R. E.</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Review of Scientific Instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Landen, O. L.</au><au>Farley, D. R.</au><au>Glendinning, S. G.</au><au>Logory, L. M.</au><au>Bell, P. M.</au><au>Koch, J. A.</au><au>Lee, F. D.</au><au>Bradley, D. K.</au><au>Kalantar, D. H.</au><au>Back, C. A.</au><au>Turner, R. E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>X-ray backlighting for the National Ignition Facility (invited)</atitle><jtitle>Review of Scientific Instruments</jtitle><date>2001-01</date><risdate>2001</risdate><volume>72</volume><issue>1</issue><spage>627</spage><epage>634</epage><pages>627-634</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>X-ray backlighting is a powerful tool for diagnosing a large variety of high-density phenomena. Traditional area backlighting techniques used at Nova and Omega cannot be extended efficiently to National Ignition Facility scale. New, more efficient backlighting sources and techniques are required and have begun to show promising results. These include a backlit-pinhole point-projection technique, pinhole and slit arrays, distributed polychromatic sources, and picket-fence backlighters. In parallel, there have been developments in improving the data signal-to-noise and, hence, quality by switching from film to charge-coupled-device-based recording media and by removing the fixed-pattern noise of microchannel-plate-based cameras.</abstract><cop>United States</cop><pub>The American Physical Society</pub><doi>10.1063/1.1315641</doi><tpages>8</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0034-6748 |
| ispartof | Review of Scientific Instruments, 2001-01, Vol.72 (1), p.627-634 |
| issn | 0034-6748 1089-7623 |
| language | eng |
| recordid | cdi_osti_scitechconnect_40204853 |
| source | American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list); AIP - American Institute of Physics |
| subjects | 70 PLASMA PHYSICS AND FUSION TECHNOLOGY CAMERAS PHYSICS US NATIONAL IGNITION FACILITY |
| title | X-ray backlighting for the National Ignition Facility (invited) |
| url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T10%3A36%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=X-ray%20backlighting%20for%20the%20National%20Ignition%20Facility%20(invited)&rft.jtitle=Review%20of%20Scientific%20Instruments&rft.au=Landen,%20O.%20L.&rft.date=2001-01&rft.volume=72&rft.issue=1&rft.spage=627&rft.epage=634&rft.pages=627-634&rft.issn=0034-6748&rft.eissn=1089-7623&rft.coden=RSINAK&rft_id=info:doi/10.1063/1.1315641&rft_dat=%3Cscitation_osti_%3Ersi%3C/scitation_osti_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c426t-4cdf785214fdb719dc6d916bfe08412f774e3ce46de1b38bf0b077e2fa3ac9203%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |