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Silicon Junctions as Particle Spectrometers
Both Au-Si surface barriers and silicon p-n junctions operate satisfactorily as particle spectrometers. The use of high resistivity material gives a depletion region wide enough to stop high-energy protons, α particles, and heavier ions. A resolution of 16 kev (width at half-maximum) for 6.04 mev α...
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Published in: | I.R.E. transactions on nuclear science 1960-06, Vol.7 (2/3), p.195-199 |
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container_end_page | 199 |
container_issue | 2/3 |
container_start_page | 195 |
container_title | I.R.E. transactions on nuclear science |
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creator | McKenzie, J. M. Waugh, J. B. S. |
description | Both Au-Si surface barriers and silicon p-n junctions operate satisfactorily as particle spectrometers. The use of high resistivity material gives a depletion region wide enough to stop high-energy protons, α particles, and heavier ions. A resolution of 16 kev (width at half-maximum) for 6.04 mev α particles is obtained with a junction depletion layer sufficient to stop 10 mev α particles. With the depletion region very close to the surface, ß particles in the range from 10 kev to several hundred kev are detectable. The pulse amplitude distribution from Co 57 indicates the presence of the two well-known lines at 115 and 129 kev. An attempt has been made to correlate the observed performance with the semiconductor parameters and the diode static characteristics. |
doi_str_mv | 10.1109/TNS2.1960.4315764 |
format | article |
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An attempt has been made to correlate the observed performance with the semiconductor parameters and the diode static characteristics.</description><identifier>ISSN: 0096-2015</identifier><identifier>EISSN: 2374-9814</identifier><identifier>DOI: 10.1109/TNS2.1960.4315764</identifier><language>eng</language><publisher>IEEE</publisher><subject>ABSORPTION ; ALPHA PARTICLES ; BETA PARTICLES ; Capacitance ; CHARGED PARTICLES ; COBALT 57 ; Counting circuits ; Detectors ; DIAGRAMS ; DIODES ; DISTRIBUTION ; ENERGY LEVELS ; ENGINEERING AND EQUIPMENT ; GOLD ; IONS ; PROTONS ; PULSES ; RESOLUTION ; Semiconductor diodes ; SEMICONDUCTORS ; Signal resolution ; SILICON ; SPECTROMETERS ; Spectroscopy ; Statistics</subject><ispartof>I.R.E. transactions on nuclear science, 1960-06, Vol.7 (2/3), p.195-199</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c207t-ca9d612aee62b7501d32bc50cd391002de3f86843ed87a423893ca440138a66e3</citedby><cites>FETCH-LOGICAL-c207t-ca9d612aee62b7501d32bc50cd391002de3f86843ed87a423893ca440138a66e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4315764$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,314,780,784,885,27923,27924,54795</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/4133309$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>McKenzie, J. 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An attempt has been made to correlate the observed performance with the semiconductor parameters and the diode static characteristics.</description><subject>ABSORPTION</subject><subject>ALPHA PARTICLES</subject><subject>BETA PARTICLES</subject><subject>Capacitance</subject><subject>CHARGED PARTICLES</subject><subject>COBALT 57</subject><subject>Counting circuits</subject><subject>Detectors</subject><subject>DIAGRAMS</subject><subject>DIODES</subject><subject>DISTRIBUTION</subject><subject>ENERGY LEVELS</subject><subject>ENGINEERING AND EQUIPMENT</subject><subject>GOLD</subject><subject>IONS</subject><subject>PROTONS</subject><subject>PULSES</subject><subject>RESOLUTION</subject><subject>Semiconductor diodes</subject><subject>SEMICONDUCTORS</subject><subject>Signal resolution</subject><subject>SILICON</subject><subject>SPECTROMETERS</subject><subject>Spectroscopy</subject><subject>Statistics</subject><issn>0096-2015</issn><issn>2374-9814</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1960</creationdate><recordtype>article</recordtype><recordid>eNo9kE1LAzEQhoMoWKs_QLwsXmXrTCab3Ryl-ElRofUc0uwUI-1uSeLBf--WVk9zmOd9eXmEuESYIIK5XbzO5QSNhokirGqtjsRIUq1K06A6FiMAo0sJWJ2Ks5S-AAgawJG4mYd18H1XvHx3Poe-S4VLxbuLOfg1F_Mt-xz7DWeO6VycrNw68cXhjsXHw_1i-lTO3h6fp3ez0kuoc-mdaTVKx6zlsq4AW5JLX4FvySCAbJlWjW4UcdvUTklqDHmnFCA1Tmumsbje9_YpB5t8yOw_h43dsMUqJCIwA4R7yMc-pcgru41h4-KPRbA7JXanxO6U2IOSIXO1zwRm_uf_vr-tDFtj</recordid><startdate>19600601</startdate><enddate>19600601</enddate><creator>McKenzie, J. 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S.</au><aucorp>Atomic Energy of Canada, Ltd., Chalk River, Ont</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Silicon Junctions as Particle Spectrometers</atitle><jtitle>I.R.E. transactions on nuclear science</jtitle><stitle>TNS2</stitle><date>1960-06-01</date><risdate>1960</risdate><volume>7</volume><issue>2/3</issue><spage>195</spage><epage>199</epage><pages>195-199</pages><issn>0096-2015</issn><eissn>2374-9814</eissn><abstract>Both Au-Si surface barriers and silicon p-n junctions operate satisfactorily as particle spectrometers. The use of high resistivity material gives a depletion region wide enough to stop high-energy protons, α particles, and heavier ions. A resolution of 16 kev (width at half-maximum) for 6.04 mev α particles is obtained with a junction depletion layer sufficient to stop 10 mev α particles. With the depletion region very close to the surface, ß particles in the range from 10 kev to several hundred kev are detectable. The pulse amplitude distribution from Co 57 indicates the presence of the two well-known lines at 115 and 129 kev. An attempt has been made to correlate the observed performance with the semiconductor parameters and the diode static characteristics.</abstract><pub>IEEE</pub><doi>10.1109/TNS2.1960.4315764</doi><tpages>5</tpages></addata></record> |
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source | IEEE Xplore (Online service) |
subjects | ABSORPTION ALPHA PARTICLES BETA PARTICLES Capacitance CHARGED PARTICLES COBALT 57 Counting circuits Detectors DIAGRAMS DIODES DISTRIBUTION ENERGY LEVELS ENGINEERING AND EQUIPMENT GOLD IONS PROTONS PULSES RESOLUTION Semiconductor diodes SEMICONDUCTORS Signal resolution SILICON SPECTROMETERS Spectroscopy Statistics |
title | Silicon Junctions as Particle Spectrometers |
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