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A Technique for the Rapid Determination of Ionization and Appearance Potentials
A method of obtaining approximate ionization and appearance potentials using a Bendix time-of-flight mass spectrometer was developed. Using this method, which is called the energy compensation technique, ionization and appearance potentials may be obtained usually in less than one minute. The method...
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Published in: | Journal of physical chemistry (1952) 1962-01, Vol.66 (5) |
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container_title | Journal of physical chemistry (1952) |
container_volume | 66 |
creator | Kiser, Robert W. Gallegos, Emilio J. |
description | A method of obtaining approximate ionization and appearance potentials using a Bendix time-of-flight mass spectrometer was developed. Using this method, which is called the energy compensation technique, ionization and appearance potentials may be obtained usually in less than one minute. The method, being instrumental in character, eliminates the necessity of obtaining the usual ionization efficiency curve. Finally, some results of ionization potentials determined for various compounds using the linear extrapolation method, logarithmic plot method, extrapolated voltages difference method, and the energy compensation method are tabulated. |
doi_str_mv | 10.1021/j100811a507 |
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Using this method, which is called the energy compensation technique, ionization and appearance potentials may be obtained usually in less than one minute. The method, being instrumental in character, eliminates the necessity of obtaining the usual ionization efficiency curve. Finally, some results of ionization potentials determined for various compounds using the linear extrapolation method, logarithmic plot method, extrapolated voltages difference method, and the energy compensation method are tabulated.</description><identifier>ISSN: 0022-3654</identifier><identifier>EISSN: 1541-5740</identifier><identifier>DOI: 10.1021/j100811a507</identifier><language>eng</language><subject>CHEMISTRY ; DIAGRAMS ; ELECTRIC POTENTIAL ; INSTRUMENTS ; IONIZATION ; MASS SPECTROMETERS ; QUANTITATIVE ANALYSIS ; SPECTRA ; TABLES</subject><ispartof>Journal of physical chemistry (1952), 1962-01, Vol.66 (5)</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,27924,27925</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/4784311$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Kiser, Robert W.</creatorcontrib><creatorcontrib>Gallegos, Emilio J.</creatorcontrib><creatorcontrib>Kansas State Univ., Manhattan</creatorcontrib><title>A Technique for the Rapid Determination of Ionization and Appearance Potentials</title><title>Journal of physical chemistry (1952)</title><description>A method of obtaining approximate ionization and appearance potentials using a Bendix time-of-flight mass spectrometer was developed. Using this method, which is called the energy compensation technique, ionization and appearance potentials may be obtained usually in less than one minute. The method, being instrumental in character, eliminates the necessity of obtaining the usual ionization efficiency curve. Finally, some results of ionization potentials determined for various compounds using the linear extrapolation method, logarithmic plot method, extrapolated voltages difference method, and the energy compensation method are tabulated.</description><subject>CHEMISTRY</subject><subject>DIAGRAMS</subject><subject>ELECTRIC POTENTIAL</subject><subject>INSTRUMENTS</subject><subject>IONIZATION</subject><subject>MASS SPECTROMETERS</subject><subject>QUANTITATIVE ANALYSIS</subject><subject>SPECTRA</subject><subject>TABLES</subject><issn>0022-3654</issn><issn>1541-5740</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1962</creationdate><recordtype>article</recordtype><recordid>eNotj8FOwzAQRC0EEqVw4gcs7oHd2I6TY1SgVKpUhHKvts5adQV2SMyFrydSOT3NHN5ohLhHeEQo8emEADUiGbAXYoFGY2GshkuxACjLQlVGX4ubaToBACqFC7FrZcfuGMP3D0ufRpmPLD9oCL185szjV4iUQ4oyeblJMfyeE8VetsPANFJ0LN9T5pgDfU634srP4Lt_LkX3-tKt3ortbr1ZtdsiYV3mAlFpT1x5rFVT9b1tqkYrto2zPNe6BiLHvasMVIa8qRs-kIODQucJSS3Fw1mbphz2kwt5PuFSjOzyXttaq3nhD3mYUAc</recordid><startdate>19620101</startdate><enddate>19620101</enddate><creator>Kiser, Robert W.</creator><creator>Gallegos, Emilio J.</creator><scope>OTOTI</scope></search><sort><creationdate>19620101</creationdate><title>A Technique for the Rapid Determination of Ionization and Appearance Potentials</title><author>Kiser, Robert W. ; Gallegos, Emilio J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-o182t-1134fae6f18396dd796943e79c7eae6480aacedc65065af589ebac0b31cfa1a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1962</creationdate><topic>CHEMISTRY</topic><topic>DIAGRAMS</topic><topic>ELECTRIC POTENTIAL</topic><topic>INSTRUMENTS</topic><topic>IONIZATION</topic><topic>MASS SPECTROMETERS</topic><topic>QUANTITATIVE ANALYSIS</topic><topic>SPECTRA</topic><topic>TABLES</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kiser, Robert W.</creatorcontrib><creatorcontrib>Gallegos, Emilio J.</creatorcontrib><creatorcontrib>Kansas State Univ., Manhattan</creatorcontrib><collection>OSTI.GOV</collection><jtitle>Journal of physical chemistry (1952)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kiser, Robert W.</au><au>Gallegos, Emilio J.</au><aucorp>Kansas State Univ., Manhattan</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Technique for the Rapid Determination of Ionization and Appearance Potentials</atitle><jtitle>Journal of physical chemistry (1952)</jtitle><date>1962-01-01</date><risdate>1962</risdate><volume>66</volume><issue>5</issue><issn>0022-3654</issn><eissn>1541-5740</eissn><abstract>A method of obtaining approximate ionization and appearance potentials using a Bendix time-of-flight mass spectrometer was developed. Using this method, which is called the energy compensation technique, ionization and appearance potentials may be obtained usually in less than one minute. The method, being instrumental in character, eliminates the necessity of obtaining the usual ionization efficiency curve. Finally, some results of ionization potentials determined for various compounds using the linear extrapolation method, logarithmic plot method, extrapolated voltages difference method, and the energy compensation method are tabulated.</abstract><doi>10.1021/j100811a507</doi></addata></record> |
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issn | 0022-3654 1541-5740 |
language | eng |
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source | American Chemical Society |
subjects | CHEMISTRY DIAGRAMS ELECTRIC POTENTIAL INSTRUMENTS IONIZATION MASS SPECTROMETERS QUANTITATIVE ANALYSIS SPECTRA TABLES |
title | A Technique for the Rapid Determination of Ionization and Appearance Potentials |
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