Evolution of order in thin block copolymer films

The organization of thin films of symmetric poly(styrene-b-methyl methacrylate) diblock copolymers on silicon is investigated by neutron and X-ray reflectivity. The surface and internal structure as a function of annealing time is compared for two sets of films 680 and 800 [angstrom] in thickness. F...

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Bibliographic Details
Published in:Macromolecules 1994-05, Vol.27 (3), p.749-755
Main Authors: Mayes, A. M, Russell, T. P, Bassereau, P, Baker, S. M, Smith, G. S
Format: Article
Language:English
Subjects:
360601 - Other Materials- Preparation & Manufacture
360602 - Other Materials- Structure & Phase Studies
ANNEALING
Applied sciences
COPOLYMERS
DATA
ESTERS
Exact sciences and technology
EXPERIMENTAL DATA
HEAT TREATMENTS
INFORMATION
MATERIALS
MATERIALS SCIENCE
MICROSTRUCTURE
NUMERICAL DATA
ORGANIC COMPOUNDS
ORGANIC POLYMERS
PETROCHEMICALS
PETROLEUM PRODUCTS
PHASE TRANSFORMATIONS
Physicochemistry of polymers
PLASTICS
PMMA
POLYACRYLATES
POLYMERS
POLYOLEFINS
POLYSTYRENE
POLYVINYLS
Properties and characterization
Structure, morphology and analysis
SURFACE PROPERTIES
SYNTHETIC MATERIALS
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Summary:The organization of thin films of symmetric poly(styrene-b-methyl methacrylate) diblock copolymers on silicon is investigated by neutron and X-ray reflectivity. The surface and internal structure as a function of annealing time is compared for two sets of films 680 and 800 [angstrom] in thickness. For the thicker films the equilibrium morphology shows no surface features since the film thickness is 2.5L where L is the period of the lamellar microdomain morphology. The thinner films, 2.1L in thickness, exhibit hole formation over 40% of the surface. In both cases the multilayer organization proceeds from the substrate upward by chain transport through channels which perforate the developing layers. For short annealing times a sharp increase in surface roughness is seen, which may linked with the wetting of PMMA-rich surface regions by polystyrene. At longer times these height fluctuations decay or grow into holes, depending on the initial film thickness.
ISSN:0024-9297
1520-5835
DOI:10.1021/ma00081a020