Eddy current microscopy using a 77-K superconducting sensor

We have used a scanning magnetic flux microscope based on a high transition temperature YBa2Cu3O7 superconducting quantum interference device (SQUID) to produce magnetic images of eddy currents in patterned Cu thin films and 11–30-μm-thick Cu on printed circuit boards. The fields produced by the edd...

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Bibliographic Details
Published in:Applied physics letters 1994-01, Vol.64 (1), p.100-102
Main Authors: Black, R. C., Wellstood, F. C., Dantsker, E., Miklich, A. H., Kingston, J. J., Nemeth, D. T., Clarke, J.
Format: Article
Language:English
Subjects:
420500 - Engineering- Materials Testing
COPPER
CURRENTS
EDDY CURRENTS
ELECTRIC CURRENTS
ELECTRONIC EQUIPMENT
ELEMENTS
ENGINEERING
FLUXMETERS
HIGH-TC SUPERCONDUCTORS
MAGNETOMETERS
MATERIALS TESTING
MEASURING INSTRUMENTS
METALS
MICROSCOPY
MICROWAVE EQUIPMENT
NONDESTRUCTIVE TESTING
RESOLUTION
SENSITIVITY
SPATIAL RESOLUTION
SQUID DEVICES
SUPERCONDUCTING DEVICES
SUPERCONDUCTORS
TESTING
TRANSITION ELEMENTS
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Summary:We have used a scanning magnetic flux microscope based on a high transition temperature YBa2Cu3O7 superconducting quantum interference device (SQUID) to produce magnetic images of eddy currents in patterned Cu thin films and 11–30-μm-thick Cu on printed circuit boards. The fields produced by the eddy currents are imaged with a spatial resolution of about 80 μm over a 100-mm2 sample area. With the sample and SQUID at 77 K, the microscope uses typical probing fields of 80 nT and can obtain simultaneously eddy current and static magnetic field images. At probing frequencies of 26–100 kHz, the system achieves a field sensitivity of about 7 pT Hz−1/2.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.110906