Different core-hole lifetime and screening in the surface of W(110)

High-resolution 4{ital f} photoemission spectra from clean W(110) show that the natural lifetime width and the (electron-hole)-pair singularity index are both larger in the first atomic layer than in the bulk. Phonon broadening for the surface and bulk components are smaller than theoretical estimat...

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Bibliographic Details
Published in:Physical review letters 1989-10, Vol.63 (18), p.1976-1979
Main Authors: RIFFE, D. M, WERTHEIM, G. K, CITRIN, P. H
Format: Article
Language:English
Subjects:
360104 - Metals & Alloys- Physical Properties
Analysing. Testing. Standards
Applied sciences
CLEANING
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Cross-disciplinary physics: materials science
rheology
CRYSTALS
DATA
DIMENSIONS
Electron and ion emission by liquids and solids
impact phenomena
ELECTRON SPECTROSCOPY
ELECTRON-HOLE DROPLETS
ELECTRONIC STRUCTURE
ELEMENTS
Exact sciences and technology
EXPERIMENTAL DATA
HOLES
INFORMATION
INNER-SHELL IONIZATION
IONIZATION
LIFETIME
LINE WIDTHS
LOW TEMPERATURE
MATERIALS SCIENCE
Measurement of properties and materials state
METALS
Metals, semimetals and alloys
Metals. Metallurgy
MONOCRYSTALS
Nondestructive testing
NUMERICAL DATA
PHOTOELECTRON SPECTROSCOPY
Photoemission and photoelectron spectra
Physics
PLASMA
RESOLUTION
SINGULARITY
SOLID-STATE PLASMA
Specific materials
SPECTROSCOPY
SURFACE CLEANING
SURFACE FINISHING
THIN FILMS
TRANSITION ELEMENTS
TUNGSTEN
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Description
Summary:High-resolution 4{ital f} photoemission spectra from clean W(110) show that the natural lifetime width and the (electron-hole)-pair singularity index are both larger in the first atomic layer than in the bulk. Phonon broadening for the surface and bulk components are smaller than theoretical estimates, and little excess broadening is detected in the surface layer. These findings are very different from the conventional picture of surface-atom core-level line shapes and have implications extending to other systems.
ISSN:0031-9007
1079-7114
DOI:10.1103/PhysRevLett.63.1976