Microstructural development in nanophase TiO[sub 2] during annealing

[ital In] [ital situ] x-ray-diffraction studies of nanophase TiO[sub 2] during annealing reveal a strong angular-dependent decrease in diffuse background intensities and a corresponding increase in rutile and anatase phase peak intensities for samples annealed above 623 K. This behavior is consisten...

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Bibliographic Details
Published in:Journal of applied physics 1994-01, Vol.75:2
Main Author: Eastman, J.A.
Format: Article
Language:English
Subjects:
360202 - Ceramics, Cermets, & Refractories- Structure & Phase Studies
AMORPHOUS STATE
ANNEALING
CHALCOGENIDES
COHERENT SCATTERING
CRYSTALLIZATION
DIFFRACTION
ENTHALPY
GRAIN GROWTH
HEAT TREATMENTS
LATTICE PARAMETERS
MATERIALS SCIENCE
MICROSTRUCTURE
OXIDES
OXYGEN COMPOUNDS
PHASE TRANSFORMATIONS
PHYSICAL PROPERTIES
SCATTERING
STRAINS
TEMPERATURE DEPENDENCE
TEMPERATURE RANGE
TEMPERATURE RANGE 0400-1000 K
TEMPERATURE RANGE 1000-4000 K
THERMODYNAMIC PROPERTIES
TITANIUM COMPOUNDS
TITANIUM OXIDES
TRANSITION ELEMENT COMPOUNDS
X-RAY DIFFRACTION
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Summary:[ital In] [ital situ] x-ray-diffraction studies of nanophase TiO[sub 2] during annealing reveal a strong angular-dependent decrease in diffuse background intensities and a corresponding increase in rutile and anatase phase peak intensities for samples annealed above 623 K. This behavior is consistent with the crystallization of an amorphous phase present in unannealed samples in addition to the two previously observed crystalline phases. The rutile lattice is significantly strained in unannealed samples, with [ital a][sub 0] increased and [ital c][sub 0] decreased compared to the values for coarse-grained material. Normal bulk lattice parameters are obtained after annealing samples at 1073 K. Assuming that strain contributions to the measured low-angle peak breadths are negligible, measurements of the time and temperature dependencies of grain growth in nanophase rutile during annealing indicate a grain growth exponent of 0.64[plus minus]0.06 and a grain growth activation enthalpy of 83[plus minus]40 kJ/mol.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.356482