Correlation of thermally stimulated luminescence with radio frequency surface resistance of high-temperature superconductors

We recently demonstrated that insulating surface impurity phases in high-temperature superconductors can be detected by thermally stimulated luminescence. Moreover, we suggested that the intensity of luminescence is related to the magnitude of the rf surface resistance. In this work we show that a q...

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Bibliographic Details
Published in:Applied physics letters 1989-09, Vol.55 (10), p.1038-1040
Main Authors: COOKE, D. W, BENNETT, B, GRAY, E. R, HOULTON, R. J, HULTS, W. L, MAEZ, M. A, MAYER, A, SMITH, J. L, JAHAN, M. S
Format: Article
Language:English
Subjects:
360204 - Ceramics, Cermets, & Refractories- Physical Properties
656100 - Condensed Matter Physics- Superconductivity
ALKALINE EARTH METAL COMPOUNDS
BARIUM COMPOUNDS
BARIUM OXIDES
CALCIUM COMPOUNDS
CALCIUM OXIDES
CHALCOGENIDES
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Condensed matter: electronic structure, electrical, magnetic, and optical properties
COPPER COMPOUNDS
COPPER OXIDES
DATA
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
Exact sciences and technology
EXPERIMENTAL DATA
IMPURITIES
INFORMATION
LUMINESCENCE
MATERIALS SCIENCE
NUMERICAL DATA
OXIDES
OXYGEN COMPOUNDS
PEROVSKITES
PHASE STUDIES
PHYSICAL PROPERTIES
Physics
Properties of type I and type II superconductors
Superconductivity
SUPERCONDUCTORS
SURFACE PROPERTIES
TEMPERATURE EFFECTS
THALLIUM COMPOUNDS
THALLIUM OXIDES
THERMOLUMINESCENCE
THIN FILMS
TRANSITION ELEMENT COMPOUNDS
TYPE-II SUPERCONDUCTORS
VERY HIGH TEMPERATURE
YTTRIUM COMPOUNDS
YTTRIUM OXIDES
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Summary:We recently demonstrated that insulating surface impurity phases in high-temperature superconductors can be detected by thermally stimulated luminescence. Moreover, we suggested that the intensity of luminescence is related to the magnitude of the rf surface resistance. In this work we show that a quantitative correlation exists between these two quantities, and that luminescence can be a very useful technique for estimating rf surface resistance.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.101724