Response of YBa sub 2 Cu sub 3 O sub 7 minus. delta. grain-boundary junctions to short light pulses

The electrical response of a single YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} grain-boundary junction to visible light pulses was measured. Using an autocorrelation technique with picosecond laser pulses, no fast voltage transients were observed with the junction biased just above its critical curre...

Full description

Saved in:
Bibliographic Details
Published in:Physical review. B, Condensed matter Condensed matter, 1991-04, Vol.43:10
Main Authors: Kaplan, S.B., Chi, C.C., Chaudhari, P., Dimos, D., Gross, R., Gupta, A., Koren, G.
Format: Article
Language:English
Subjects:
360204 - Ceramics, Cermets, & Refractories- Physical Properties
ALKALINE EARTH METAL COMPOUNDS
BARIUM COMPOUNDS
BARIUM OXIDES
CHALCOGENIDES
COPPER COMPOUNDS
COPPER OXIDES
CRYSTAL STRUCTURE
ELECTRO-OPTICAL EFFECTS
GRAIN BOUNDARIES
LOW TEMPERATURE
MATERIALS SCIENCE
MICROSTRUCTURE
OXIDES
OXYGEN COMPOUNDS
RELAXATION TIME
SUPERCONDUCTING FILMS
TEMPERATURE DEPENDENCE
TRANSITION ELEMENT COMPOUNDS
ULTRALOW TEMPERATURE
VERY LOW TEMPERATURE
YTTRIUM COMPOUNDS
YTTRIUM OXIDES
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The electrical response of a single YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} grain-boundary junction to visible light pulses was measured. Using an autocorrelation technique with picosecond laser pulses, no fast voltage transients were observed with the junction biased just above its critical current. Apparently, there are no relaxation times in the range of 7 ps to 14 ns. Using direct time-domain measurement with nanosecond pulses, three types of junction response were recorded: a nonexponential decay of 11 {mu}s (90 to 10 % time) at temperatures near {ital T}{sub {ital c}}; an inverse-time dependence of the order of 0.3 {mu}s (100 to 50 % time) in the temperature range of 4.2 to 15 K; and an exponential decay time of 0.15 {mu}s with the sample immersed in superfluid helium.
ISSN:0163-1829
1095-3795
DOI:10.1103/PhysRevB.43.8627