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Resonant dielectronic and direct excitation in crystal channels

We have observed dielectronic and direct excitation of H-like S{sup 15+} and Ca{sup 19+} and He-like Ti{sup 20+} ions in silicon channels caused by collision with weakly bound target electrons which behave as a free-electron gas. As {ital in} acuo, relaxation of the doubly excited states can occur r...

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Bibliographic Details
Published in:Physical review letters 1989-08, Vol.63 (7), p.742-745
Main Authors: DATZ, S, VANE, C. R, ROSSEEL, T. M, DITTNER, P. F, GIESE, J. P, GOMEZ DEL CAMPO, J, JONES, N. L, KRAUSE, H. F, MILLER, P. D, SCHULZ, M, SCHONE, H
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Language:English
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Summary:We have observed dielectronic and direct excitation of H-like S{sup 15+} and Ca{sup 19+} and He-like Ti{sup 20+} ions in silicon channels caused by collision with weakly bound target electrons which behave as a free-electron gas. As {ital in} acuo, relaxation of the doubly excited states can occur radiatively leading to ions of decreased charge, but in a crystal channel collisional effects can cause double ionization. The effects are seen in both the x-ray yields and charge-state fractions, and, in the case of Ti{sup 20+}, in charge-state x-ray coincidences.
ISSN:0031-9007
1079-7114
DOI:10.1103/PhysRevLett.63.742