Monolayer Sm films on Ta and Cu substrates

We have studied the electronic properties of ultrathin layers of Sm on Ta and Cu substrates using valence-band and resonant photoemission. The average formal chemical valence of Sm on Ta increases from below 2.4 at low coverage to the value measured from bulk Sm at higher coverage, while the valence...

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Bibliographic Details
Published in:Physical review. B, Condensed matter Condensed matter, 1993-11, Vol.48 (20), p.15289-15296
Main Authors: TAO, L, GOERING, E, HORN, S, DENBOER, M. L
Format: Article
Language:English
Subjects:
360104 - Metals & Alloys- Physical Properties
Applied sciences
CHEMICAL STATE
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
COPPER
ELECTRONIC STRUCTURE
Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures
ELEMENTS
EMISSION
Exact sciences and technology
Impurity and defect levels
energy states of adsorbed species
INTERATOMIC FORCES
Lattice dynamics
MATERIALS SCIENCE
METALS
Metals. Metallurgy
Phonon-electron and phonon-phonon interactions
Phonons and vibrations in crystal lattices
PHOTOEMISSION
Physics
RARE EARTHS
SAMARIUM
SECONDARY EMISSION
SUBSTRATES
Surface and interface electron states
TANTALUM
TRANSITION ELEMENTS
VALENCE
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Summary:We have studied the electronic properties of ultrathin layers of Sm on Ta and Cu substrates using valence-band and resonant photoemission. The average formal chemical valence of Sm on Ta increases from below 2.4 at low coverage to the value measured from bulk Sm at higher coverage, while the valence of Sm on Cu is 3 at low coverage and decreases abruptly to the same value measured for Ta substrates at higher coverage. These changes in electronic properties reflect interlayer and intralayer interactions in these films, particularly the weak Sm-Ta and strong Sm-Cu interactions.
ISSN:0163-1829
1095-3795
DOI:10.1103/PhysRevB.48.15289