Analysis for rare earth elements in silicates by ion microprobe using doubly-charged ions

A study developed a method for measuring rare earth element (REE) concentrations in silicates that used a Cameca ims-4f ion microprobe and doubly-charged, odd-mass isotopes. The technique offers fast and simple REE analysis.

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Bibliographic Details
Published in:Analytical chemistry (Washington) 1993-05, Vol.65 (9), p.1186-1191
Main Authors: Riciputi, Lee R, Christie, W. H, Cole, David R, Rosseel, Thomas M
Format: Article
Language:English
Subjects:
400101 - Activation, Nuclear Reaction, Radiometric & Radiochemical Procedures
580000 - Geosciences
Analytical chemistry
CHEMICAL ANALYSIS
Chemistry
ELEMENTS
Exact sciences and technology
GEOLOGY
GEOSCIENCES
INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY
ION MICROPROBE ANALYSIS
ISOTOPE RATIO
METALS
MICROANALYSIS
MINERALS
NONDESTRUCTIVE ANALYSIS
PETROGENESIS
PETROLOGY
QUANTITATIVE CHEMICAL ANALYSIS
RARE EARTHS
Scientific imaging
SILICATE MINERALS
Spectrometric and optical methods
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Description
Summary:A study developed a method for measuring rare earth element (REE) concentrations in silicates that used a Cameca ims-4f ion microprobe and doubly-charged, odd-mass isotopes. The technique offers fast and simple REE analysis.
ISSN:0003-2700
1520-6882
DOI:10.1021/ac00057a014