CdTe semiconductor X-ray imaging sensor and energy subtraction method using X-ray energy information

• Published in: IEEE transactions on nuclear science 1993-04, Vol.40 (2), p.95-101
• Main Authors: Tsutsui, H., Ohtsuchi, T., Ohmori, K., Baba, S.
• Format: Article
• Language: English
• Subjects: 420500 - Engineering- Materials Testing; 440101 - Radiation Instrumentation- General Detectors or Monitors & Radiometric Instruments; CDTE SEMICONDUCTOR DETECTORS; DESIGN; ELECTROMAGNETIC RADIATION; Energy resolution; ENGINEERING; Exact sciences and technology; FEASIBILITY STUDIES; Image analysis; IMAGE INTENSIFIERS; Image sensors; INDUSTRIAL RADIOGRAPHY; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; IONIZING RADIATIONS; MEASURING INSTRUMENTS; Optoelectronic and photonic sensors; Physics; RADIATION DETECTORS; RADIATIONS; Radiography; SEMICONDUCTOR DETECTORS; Semiconductor radiation detectors; Sensor arrays; X RADIATION; X- and γ-ray instruments and techniques; X-ray detection; X-ray detectors; X-ray imaging; X-RAY RADIOGRAPHY
• ISSN: 0018-9499; 1558-1578
• DOI: 10.1109/23.212323

A multichannel X-ray imaging sensor using a CdTe compound semiconductor radiation detector was developed. Both the digital X-ray imaging and energy-information-generating analyzing method were studied. The X-ray imaging sensor consisted of 512-channel CdTe detector elements at a pitch of 0.2 mm. X-ray photons were directly detected using a photon-counting method and high- and low-energy images were obtained simultaneously. The specific resolution was obtained over 2.5 line pairs/mm in the channel direction and 1.6 line pairs/mm in the scanning direction with a scanning pitch of 0.2 mm. The energy subtraction method was found to be effective in distinguishing an object's component materials.< >