Microwave microscopy using a superconducting quantum interference device

We present results on a near-field scanning probe microwave microscope which is based on the nonlinear behavior of a YBa2Cu3O7 direct-current superconducting quantum interference device (SQUID). Our system has a spatial resolution of about 30 μm and derives its probing field from circulating current...

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Bibliographic Details
Published in:Applied physics letters 1995-01, Vol.66 (1), p.99-101
Main Authors: Black, R. C., Wellstood, F. C., Dantsker, E., Miklich, A. H., Nemeth, D. T., Koelle, D., Ludwig, F., Clarke, J.
Format: Article
Language:English
Subjects:
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
ELECTRONIC EQUIPMENT
FLUXMETERS
FREQUENCY DEPENDENCE
HIGH-TC SUPERCONDUCTORS
MEASURING INSTRUMENTS
MICROSCOPY
MICROWAVE EQUIPMENT
MICROWAVE SPECTRA
OSCILLATORS
RESOLUTION
SPATIAL RESOLUTION
SPECTRA
SQUID DEVICES
SUPERCONDUCTING DEVICES
SUPERCONDUCTORS 665412 > Superconducting Devices-- (1992-)
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Summary:We present results on a near-field scanning probe microwave microscope which is based on the nonlinear behavior of a YBa2Cu3O7 direct-current superconducting quantum interference device (SQUID). Our system has a spatial resolution of about 30 μm and derives its probing field from circulating currents in the SQUID loop. The frequency is set by the Josephson relation and is continuously tunable up to about 200 GHz. By imaging small patterned normal metal thin-film samples of Cu and Nb at 77 K, we have confirmed the operating bandwidth of the system and investigated the nature of the imaging process.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.114159