Carrier recombination rate in GaAs-AlGaAs single quantum well lasers under high levels of excitation

The carrier recombination rate in GaAs-AlGaAs single quantum well layers is investigated using a small-signal technique for carrier densities from 1017 to 1019/cm3. For carrier densities up to mid 1018/cm3, the inverse of the differential carrier lifetime, 1/τd, increases linearly with the carrier d...

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Bibliographic Details
Published in:Applied physics letters 1990-05, Vol.56 (21), p.2083-2085
Main Authors: WANG, P, LEE, K. K, YAO, G, CHEN, Y. C, WATERS, R. G
Format: Article
Language:English
Subjects:
360603 > Materials-- Properties
ALUMINIUM ARSENIDES
ALUMINIUM COMPOUNDS
ARSENIC COMPOUNDS
ARSENIDES
CARRIER DENSITY
CARRIER LIFETIME
CURRENTS
ELECTRIC CURRENTS
ENGINEERING
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
LASER CAVITIES
LASERS
LIFETIME
MATERIALS SCIENCE
Optics
Physics
PNICTIDES
Quantum optics
RECOMBINATION
SEMICONDUCTOR DEVICES
SEMICONDUCTOR LASERS
SOLID STATE LASERS 426002 > Engineering-- Lasers & Masers-- (1990-)
THRESHOLD CURRENT
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Summary:The carrier recombination rate in GaAs-AlGaAs single quantum well layers is investigated using a small-signal technique for carrier densities from 1017 to 1019/cm3. For carrier densities up to mid 1018/cm3, the inverse of the differential carrier lifetime, 1/τd, increases linearly with the carrier density. The differential rate, however, saturates at higher carrier densities and remains nearly constant for carrier densities higher than 1019/cm3. The deviation from the bulk recombination behavior is due to a portion of the injected carriers populating the semicontinuum states where the rate for the radiative transition is much smaller. The experimental data indicate that the runaway increase of threshold current with decreasing cavity length commonly observed in the short-cavity lasers is mainly due to the loss of carrier confinement at high carrier densities rather than due to fast carrier-depleting processes, such as Auger recombination.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.102979