Determination of the interfacial roughness exponent in rare-earth superlattices

The interfacial roughness in Ho/Y and Ho/Lu superlattices has been studied using high-resolution x-ray diffraction. The transverse width of the superlattice Bragg peaks broadens almost linearly as a function of the component of the reduced wave vector parallel to the growth direction, while the line...

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Bibliographic Details
Published in:Physical review letters 1994-10, Vol.73 (16), p.2232-2235
Main Authors: Swaddling, PP, McMorrow, DF, Cowley, RA, Ward, RC, Wells, MR
Format: Article
Language:English
Subjects:
360102 - Metals & Alloys- Structure & Phase Studies
665100 - Nuclear Techniques in Condensed Matter Physics - (1992-)
BREMSSTRAHLUNG
COHERENT SCATTERING
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
DIFFRACTION
ELECTROMAGNETIC RADIATION
ELEMENTS
EPITAXY
HOLMIUM
INTERFACES
LINE WIDTHS
LUTETIUM
MATERIALS SCIENCE
METALS
MOLECULAR BEAM EPITAXY
MORPHOLOGY
RADIATIONS
RARE EARTHS
ROUGHNESS
SCATTERING
SUPERLATTICES
SURFACE PROPERTIES
SYNCHROTRON RADIATION
TRANSITION ELEMENTS
X-RAY DIFFRACTION
YTTRIUM
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Summary:The interfacial roughness in Ho/Y and Ho/Lu superlattices has been studied using high-resolution x-ray diffraction. The transverse width of the superlattice Bragg peaks broadens almost linearly as a function of the component of the reduced wave vector parallel to the growth direction, while the line shape is invariant, and is described by a Lorentzian raised to the power of [approx]5/2. These results are interpreted as a signature of conformally rough interfaces, and the roughness exponent is determined to be [alpha]=0.85[plus minus]0.05. It is also shown how [alpha] may be altered by adjusting the growth conditions.
ISSN:0031-9007
1079-7114
DOI:10.1103/PhysRevLett.73.2232